Material matters in superconducting qubits von Murray, Conal E.

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Analytical Modeling of Participation Reduction in Superconducting Coplanar Resonator and Qubit Designs Through Substrate Trenching von Murray, Conal E.

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Auxetic crystals under stress: Peering into their mechanics using x-rays von Murray, Conal E.

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Effects of strain energy on the recrystallization within narrow metallization von Murray, Conal E.

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Review Article: Stress in thin films and coatings: Current status, challenges, and prospects von Abadias, Grégory, Chason, Eric, Keckes, Jozef, Sebastiani, Marco, Thompson, Gregory B., Barthel, Etienne, Doll, Gary L., Murray, Conal E., Stoessel, Chris H., Martinu, Ludvik

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Analytical Determination of Participation in Superconducting Coplanar Architectures von Murray, Conal E., Gambetta, Jay M., McClure, Douglas T., Steffen, Matthias

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High-mobility ultrathin semiconducting films prepared by spin coating von Mitzi, David B., Kosbar, Laura L., Murray, Conal E., Copel, Matthew, Afzali, Ali

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Predicting substrate resonance mode frequency shifts using conductive, through-substrate vias von Murray, Conal E., Abraham, D. W.

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Equivalence of Kröner and weighted Voigt-Reuss models for x-ray stress determination von Murray, Conal E.

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Origin of stress gradients induced in capped, copper metallization von Murray, Conal E.

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Low-Energy Proton-Induced Single-Event-Upsets in 65 nm Node, Silicon-on-Insulator, Latches and Memory Cells von Rodbell, K.P., Heidel, D.F., Tang, H.H.K., Gordon, M.S., Oldiges, P., Murray, C.E.

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Strain imaging of nanoscale semiconductor heterostructures with x-ray Bragg projection ptychography von Holt, Martin V, Hruszkewycz, Stephan O, Murray, Conal E, Holt, Judson R, Paskiewicz, Deborah M, Fuoss, Paul H

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Quantification of local strain distributions in nanoscale strained SiGe FinFET structures von Mochizuki, Shogo, Murray, Conal E., Madan, Anita, Pinto, Teresa, Wang, Yun-Yu, Li, Juntao, Weng, Weihao, Jagannathan, Hemanth, Imai, Yasuhiko, Kimura, Shigeru, Takeuchi, Shotaro, Sakai, Akira

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Tailoring capping layers to reduce stress gradients in copper metallization von Murray, Conal E., Priyadarshini, Deepika, Nguyen, Son, Ryan, E. Todd

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Linking strain anisotropy and plasticity in copper metallization von Murray, Conal E., Jordan-Sweet, Jean, Priyadarshini, Deepika, Nguyen, Son

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Measurements of radioactive contaminants in semiconductor materials von Gordon, Michael S, Rodbell, Kenneth P, Murray, Conal E, McNally, Brendan D

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Silicide-phase evolution and platinum redistribution during silicidation of Ni0.95Pt0.05/Si(100) specimens von Adusumilli, Praneet, Seidman, David N., Murray, Conal E.

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Solution-Processed Metal Chalcogenide Films for p-Type Transistors von Milliron, Delia J, Mitzi, David B, Copel, Matthew, Murray, Conal E

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The Role of Sample Geometry on Ultra-Low Alpha Particle Emissivity Measurements von Gordon, Michael S., Rodbell, Kenneth P., Murray, Conal E., McNally, Brendan D.

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High-Mobility p-Type Transistor Based on a Spin-Coated Metal Telluride Semiconductor von Mitzi, D. B., Copel, M., Murray, C. E.

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