A design for test technique for parametric analysis of SRAM: on-die low yield analysis von Mauck, B.M., Ravichandran, V., Mughal, U.A.

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Circuit compensation technique von MUGHAL USMAN AZEEZ, LIM CHEE HOW

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Circuit compensation technique von Lim, Chee How, Mughal, Usman Azeez

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Bus termination scheme for flexible uni-processor and dual processor platforms von Ramachandran, Vijayalakshmi, Mughal, Usman Azeez, Lim, Chee How

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Bus termination scheme for flexible uni-processor and dual processor platforms von RAMACHANDRAN VIJAYALAKSHMI, MUGHAL USMAN AZEEZ, LIM CHEE HOW

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BUS TERMINATION SCHEME FOR FLEXIBLE UNI-PROCESSOR AND DUAL PROCESSOR PLATFORMS von RAMACHANDRAN VIJAYALAKSHMI, MUGHAL USMAN AZEEZ, LIM CHEE HOW

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Variable lock window for a phase locked loop von KAMAL MASUD, WONG KENG L, MUGHAL USMAN AZEEZ, LIM CHEE HOW, CALLAHAN KENT R

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Variable lock window for a phase locked loop von Wong, Keng L, Mughal, Usman Azeez, Kamal, Masud, Lim, Chee How, Callahan, Kent R

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Variable lock window for a phase locked loop von KAMAL MASUD, WONG KENG L, MUGHAL USMAN AZEEZ, LIM CHEE HOW, CALLAHAN KENT R

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