Physics Based Fault Models for Testing High-Voltage LDMOS von Kannan, S., Kim, B., Gupta, A., Taenzler, F., Antley, R., Moushegian, K.

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Physics-Based Low-Cost Test Technique for High Voltage LDMOS von Kannan, Sukeshwar, Kannan, Kaushal, Kim, Bruce C., Taenzler, Friedrich, Antley, Richard, Moushegian, Ken, Butler, Kenneth M., Mirizzi, Doug

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ON-CHIP ANALOG-TO-DIGITAL CONVERTER (ADC) LINEARITY TEST FOR EMBEDDED DEVICES von MOUSHEGIAN, Ken, ALLEMAN, Andrew, HARRINGTON, Cormac

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ON-CHIP ANALOG-TO-DIGITAL CONVERTER (ADC) LINEARITY TEST FOR EMBEDDED DEVICES von MOUSHEGIAN, Ken, ALLEMAN, Andrew, HARRINGTON, Cormac

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ON-CHIP ANALOG-TO-DIGITAL CONVERTER (ADC) LINEARITY TEST FOR EMBEDDED DEVICES von MOUSHEGIAN, Ken, ALLEMAN, Andrew, HARRINGTON, Cormac

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ON-CHIP ANALOG-TO-DIGITAL CONVERTER (ADC) LINEARITY TEST FOR EMBEDDED DEVICES von MOUSHEGIAN, Ken, ALLEMAN, Andrew, HARRINGTON, Cormac

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On-chip analog-to-digital converter (ADC) linearity text for embedded devices von MOUSHEGIAN KEN, HARRINGTON CORMAC, ALLEMAN ANDREW

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ON-CHIP ANALOG-TO-DIGITAL CONVERTER (ADC) LINEARITY TEST FOR EMBEDDED DEVICES von HARRINGTON, CORMAC, MOUSHEGIAN, KEN, ALLEMAN, ANDREW

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ON-CHIP ANALOG-TO-DIGITAL CONVERTER (ADC) LINEARITY TEXT FOR EMBEDDED DEVICES von MOUSHEGIAN KEN, HARRINGTON CORMAC, ALLEMAN ANDREW

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Novel ESD Protection Scheme for Testing High Voltage LDMOS von Kannan, Sukeshwar, Kim, Bruce, Taenzler, Friedrich, Antley, Richard, Moushegian, Ken

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Fast on-chip oscillator trimming von MOUSHEGIAN KEN, HARRINGTON CORMAC, ALLEMAN ANDREW, GRANT DAVID A, WEGNER HAGEN

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FAST ON-CHIP OSCILLATOR TRIMMING von MOUSHEGIAN KEN, HARRINGTON CORMAC, ALLEMAN ANDREW, GRANT DAVID A, WEGNER HAGEN

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On-chip analog-to-digital converter (adc) linearity test for embedded devices von MOUSHEGIAN KEN, HARRINGTON CORMAC, ALLEMAN ANDREW

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