A new microfluidic pressure-controlled Field Effect Transistor (pFET) in digital fluidic switch operation mode von Vourdas, Nikolaos, Moschou, Despina C., Papadopoulos, Konstantinos A., Davazoglou, Dimitrios, Stathopoulos, Vassilis N.

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Characterization of double gate TFTs fabricated in advanced SLS ELA polycrystalline silicon films von Kouvatsos, Dimitrios N., Farmakis, Filippos V., Moschou, Despina C., Kontogiannopoulos, Giannis P., Papaioannou, George J., Voutsas, Apostolos T.

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On the optical properties of SLS ELA polycrystalline silicon films von Moschou, Despina C., Vourdas, Nikolaos, Davazoglou, Dimitrios, Kouvatsos, Dimitrios N., Vamvakas, Vassilis Emm, Voutsas, Apostolos T.

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Vg,max−Vth: A new electrical characterization parameter reflecting the polysilicon film quality of LTPS TFTs von Moschou, Despina C., Farmakis, Filippos V., Kouvatsos, Dimitrios N., Voutsas, Apostolos T.

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On the importance of the Vg,max―Vth parameter on LTPS TFT stressing behavior von MOSCHOU, Despina C, KONTOGIANNOPOULOS, Giannis P, KOUVATSOS, Dimitrios N, VOUTSAS, Apostolos T

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The effect of crystallization technology and gate insulator deposition method on the performance and reliability of polysilicon TFTs von Moschou, Despina C., Kontogiannopoulos, Giannis P., Kouvatsos, Dimitrios N., Voutsas, Apostolos T.

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A novel SLS ELA crystallization process and its effects on polysilicon film defectivity and TFT performance von Moschou, Despina C., Exarchos, M.A., Kouvatsos, D.N., Papaioannou, G.J., Voutsas, A.T.

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Short Channel Effects on LTPS TFT Degradation von Moschou, Despina C., Theodorou, Christoforos G., Hastas, Nikolaos A., Tsormpatzoglou, Andreas, Kouvatsos, Dimitrios N., Voutsas, Apostolos T., Dimitriadis, Charalabos A.

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On the importance of the V g,max– V th parameter on LTPS TFT stressing behavior von Moschou, Despina C., Kontogiannopoulos, Giannis P., Kouvatsos, Dimitrios N., Voutsas, Apostolos T.

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Trap properties of asymmetrical double-gate polysilicon thin-film transistors with low frequency noise in terms of the grain boundaries direction von Hastas, N., Tsormpatzoglou, A., Pappas, I., Kouvatsos, D. N., Moschou, D. C., Voutsas, A. T., Dimitriadis, C. A.

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Impact of surface roughness on the self-assembling of molecular films onto gold electrodes for label-free biosensing applications von Dutta, Gorachand, Fernandes, Flavio C.B., Estrela, Pedro, Moschou, Despina, Bueno, Paulo R.

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Impact of Surface Roughness on the Self-Assembling of Molecular Films onto Gold Electrodes for Label-Free Biosensing Applications von Dutta, Gorachand, Fernandes, Flavio C. B., Estrela, Pedro, Moschou, Despina, Bueno, Paulo Roberto

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