Microstructural analysis of Ta-containing NiCoCrAlY bond coats deposited by HVOF on different Ni-based superalloys von Mora-García, A.G., Ruiz-Luna, H., Mosbacher, M., Popp, R., Schulz, U., Glatzel, U., Muñoz-Saldaña, J.

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Imaging optical near-fields of nanostructures von Leiderer, P., Bartels, C., König-Birk, J., Mosbacher, M., Boneberg, J.

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Optical field enhancement effects in laser-assisted particle removal von MOSBACHER, M, MÜNZER, H.-J, ZIMMERMANN, J, SOLIS, J, BONEBERG, J, LEIDERER, P

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Local field enhancement effects for nanostructuring of surfaces von Münzer, H.‐J., Mosbacher, M., Bertsch, M., Zimmermann, J., Leiderer, P., Boneberg, J.

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Imprinting the Optical Near Field of Microstructures with Nanometer Resolution von Kühler, P., García de Abajo, F. J., Solis, J., Mosbacher, M., Leiderer, P., Afonso, C.N., Siegel, J.

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Ultraviolet optical near-fields of microspheres imprinted in phase change films von Siegel, J., Puerto, D., Solis, J., García de Abajo, F. J., Afonso, C. N., Longo, M., Wiemer, C., Fanciulli, M., Kühler, P., Mosbacher, M., Leiderer, P.

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Infrared steam laser cleaning von Frank, P., Lang, F., Mosbacher, M., Boneberg, J., Leiderer, P.

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Near field induced defects and influence of the liquid layer thickness in Steam Laser Cleaning of silicon wafers von Lang, F., Mosbacher, M., Leiderer, P.

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Universal threshold for the steam laser cleaning of submicron spherical particles from silicon von Mosbacher, M., Dobler, V., Boneberg, J., Leiderer, P.

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Matrix laser cleaning : a new technique for the removal of nanometer sized particles from semiconductors von GRAF, J, LUK'YANCHUK, B. S, MOSBACHER, M, HONG, M. H, CHONG, C. T, BONEBERG, J, LEIDERER, P

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Creep behavior of polycrystalline and single crystal Ni-based superalloys coated with Ta-containing NiCoCrAlY by high-velocity oxy-fuel spraying von Mora-García, A.G., Mosbacher, M., Hastreiter, J., Völkl, R., Glatzel, U., Muñoz-Saldaña, J.

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Opposed jet flames of lean or rich premixed propane-air reactants versus hot products von Wehrmeyer, Joseph A, Cheng, Zhongxian, Mosbacher, David M, Pitz, Robert W, Osborne, Robin

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Laser cleaning of polymer surfaces von FOURRIER, T, SCHREMS, G, MÜHLBERGER, T, HEITZ, J, ARNOLD, N, BÄUERLE, D, MOSBACHER, M, BONEBERG, J, LEIDERER, P

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A comparison of ns and ps steam laser cleaning of Si surfaces von Mosbacher, M., Chaoui, N., Siegel, J., Dobler, V., Solis, J., Boneberg, J., Afonso, C.N., Leiderer, P.

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Surface acceleration during dry laser cleaning of silicon von Dobler, V., Oltra, R., Boquillon, J.P., Mosbacher, M., Boneberg, J., Leiderer, P.

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A high-sensitivity in situ optical diagnostic technique for laser cleaning of transparent substrates von Chaoui, N., Solis, J., Afonso, C.N., Fourrier, T., Muehlberger, T., Schrems, G., Mosbacher, M., Bäuerle, D., Bertsch, M., Leiderer, P.

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Laser Cleaning of Particles from Silicon Wafers: Capabilities and Mechanisms von Leiderer, P., Mosbacher, M., Lang, F., Graf, Johannes

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Bartonella henselae and the Potential for Arthropod Vector-Borne Transmission von Mosbacher, Mark E., Klotz, Stephen, Klotz, John, Pinnas, Jacob L.

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Experimental and numerical investigation of premixed tubular flames von Mosbacher, David M., Wehrmeyer, Joseph A., Pitz, Robert W., Sung, Chih-Jen, Byrd, John L.

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Infrared steam laser cleaning: Laser Processing von FRANK, P, LANG, F, MOSBACHER, M, BONEBERG, J, LEIDERER, P

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