Cryogenic operation of NanoBridge at 4 K for controlling qubit von Okamoto, Koichiro, Tanaka, Takahisa, Miyamura, Makoto, Ishikuro, Hiroki, Uchida, Ken, Sakamoto, Toshitsugu, Tada, Munehiro

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Improved Switching Voltage Variation of Cu Atom Switch for Nonvolatile Programmable Logic von Banno, Naoki, Tada, Munehiro, Sakamoto, Toshitsugu, Okamoto, Koichiro, Miyamura, Makoto, Iguchi, Noriyuki, Hada, Hiromitsu

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28nm Atom-Switch FPGA: Static Timing Analysis and Evaluation von BAI, Xu, NEBASHI, Ryusuke, MIYAMURA, Makoto, FUNAHASHI, Kazunori, BANNO, Naoki, OKAMOTO, Koichiro, NUMATA, Hideaki, IGUCHI, Noriyuki, SUGIBAYASHI, Tadahiko, SAKAMOTO, Toshitsugu, TADA, Munehiro

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NanoBridge-Based FPGA in High-Temperature Environments von Miyamura, Makoto, Sakamoto, Toshitsugu, Xu Bai, Tsuji, Yukihide, Morioka, Ayuka, Nebashi, Ryusuke, Tada, Munehiro, Banno, Naoki, Okamoto, Koichiro, Iguchi, Noriyuki, Hada, Hiromitsu, Sugibayashi, Tadahiko, Nagamatsu, Yuya, Ookubo, Soichi, Shirai, Takuma, Sugai, Fumihito, Inaba, Masayuki

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Architecture optimization of nanobridge-based field-programmable gate array and its evaluation von Bai, Xu, Sakamoto, Toshitsugu, Tsuji, Yukihide, Miyamura, Makoto, Morioka, Ayuka, Nebashi, Ryusuke, Tada, Munehiro, Banno, Naoki, Okamoto, Koichiro, Iguchi, Noriyuki, Hada, Hiromitsu, Sugibayashi, Tadahiko

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Impact of overshoot current on set operation of atom switch von Sakamoto, Toshitsugu, Tada, Munehiro, Miyamura, Makoto, Banno, Naoki, Okamoto, Koichi, Iguchi, Noriyuki, Hada, Hiromitsu

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Mechanism of OFF-state lifetime improvement in complementary atom switch von Banno, Naoki, Tada, Munehiro, Sakamoto, Toshitsugu, Miyamura, Makoto, Okamoto, Koichiro, Iguchi, Noriyuki, Nohisa, Tatsuhiko, Hada, Hiromitsu

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Publisher’s Note: “Mechanism of OFF-state lifetime improvement in complementary atom switch” von Banno, Naoki, Tada, Munehiro, Sakamoto, Toshitsugu, Miyamura, Makoto, Okamoto, Koichiro, Iguchi, Noriyuki, Nohisa, Tatsuhiko, Hada, Hiromitsu

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ON-State Reliability of Solid-Electrolyte Switch under Pulsed Alternating Current Stress for Programmable Logic Device von Banno, Naoki, Sakamoto, Toshitsugu, Tada, Munehiro, Miyamura, Makoto, Okamoto, Koichiro, Hada, Hiromitsu, Aono, Masakazu

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Electron holography analysis of a shallow junction for planar-bulk metal-oxide-semiconductor field-effect transistors approaching the scaling limit von Ikarashi, Nobuyuki, Ikezawa, Takeshi, Uejima, Kazuya, Fukai, Toshinori, Miyamura, Makoto, Toda, Akio, Hane, Masami

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Low-power embedded read-only memory using atom switch and silicon-on-thin-buried-oxide transistor von Sakamoto, Toshitsugu, Tada, Munehiro, Tsuji, Yukihide, Makiyama, Hideki, Hasegawa, Takumi, Yamamoto, Yoshiki, Okanishi, Shinobu, Banno, Naoki, Miyamura, Makoto, Okamoto, Koichiro, Iguchi, Noriyuki, Ogasahara, Yasuhiro, Oda, Hidekazu, Kamohara, Shiro, Yamagata, Yasushi, Sugii, Nobuyuki, Hada, Hiromitsu

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Electron energy-loss spectroscopy analysis of the electronic structure of nitrided Hf silicate films von Ikarashi, Nobuyuki, Miyamura, Makoto, Masuzaki, Koji, Tatsumi, Toru

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A Non-volatile Reconfigurable Offloader for Wireless Sensor Nodes von Nakaya, Shogo, Miyamura, Makoto, Sakimura, Noburo, Nakamura, Yuichi, Sugibayashi, Tadahiko

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Electron Holography Characterization of Ultra Shallow Junctions in 30-nm-Gate-Length Metal–Oxide–Semiconductor Field-Effect Transistors von Ikarashi, Nobuyuki, Oshida, Makiko, Miyamura, Makoto, Saitoh, Motofumi, Mineji, Akira, Shishiguchi, Seiichi

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Improved ON-State Reliability of Atom Switch Using Alloy Electrodes von Tada, Munehiro, Sakamoto, Toshitsugu, Banno, Naoki, Okamoto, Koichiro, Iguchi, Noriyuki, Hada, Hiromitsu, Miyamura, Makoto

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Improved Off-State Reliability of Nonvolatile Resistive Switch With Low Programming Voltage von Tada, Munehiro, Sakamoto, Toshitsugu, Miyamura, Makoto, Banno, Naoki, Okamoto, Koichiro, Iguchi, Noriyuki, Hada, Hiromitsu

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28nm Atom-Switch FPGA: Static Timing Analysis and Evaluation von Bai, Xu, Nebashi, Ryusuke, Miyamura, Makoto, Funahashi, Kazunori, Banno, Naoki, Okamoto, Koichiro, Numata, Hideaki, Iguchi, Noriyuki, Sugibayashi, Tadahiko, Sakamoto, Toshitsugu, Tada, Munehiro

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An atom-switch-based field-programmable gate array with optimized driving capability buffer von Bai, Xu, Miyamura, Makoto, Nebashi, Ryusuke, Morioka, Ayuka, Banno, Naoki, Okamoto, Koichiro, Numata, Hideaki, Hada, Hiromitsu, Sugibayashi, Tadahiko, Sakamoto, Toshitsugu, Tada, Munehiro

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(Invited) Atom Switch Technology for Low-Power Nonvolatile Logic Application von Tada, Munehiro, Sakamoto, Toshitsugu, Miyamura, Makoto, Banno, Naoki, Okamoto, Koichiro, Hada, Hiromitsu

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The influence of incorporated nitrogen on the thermal stabilityof amorphous Hf O 2 and Hf silicate von Ikarashi, Nobuyuki, Watanabe, Koji, Masuzaki, Koji, Nakagawa, Takashi, Miyamura, Makoto

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