Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of th... von Minkov, Dorian, Angelov, George, Marquez, Emilio, Radonov, Rossen, Rusev, Rostislav, Nikolov, Dimitar, Ruano, Susana

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Method for superior denoising of UV/Vis/NIR transmittance spectra of thin films von Minkov, Dorian, Angelov, George, Nikolov, Dimitar, Rusev, Rostislav, Marquez, Emilio, Fernandez, Susana

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Influence of substrate absorption on the optical and geometrical characterization of thin dielectric films von González-Leal, Juan-María, Prieto-Alcón, Rafael, Angel, José-Andrés, Minkov, Dorian A, Márquez, Emilio

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Hybrid Dispersion Model Characterization of PAZO Azopolymer Thin Films over the Entire Transmittance Spectrum Measured in the UV/VIS/NIR Spectral Region von Minkov, Dorian, Nedelchev, Lian, Angelov, George, Marquez, Emilio, Blagoeva, Blaga, Mateev, Georgi, Nazarova, Dimana

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Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum von Minkov, Dorian, Marquez, Emilio, Angelov, George, Gavrilov, Gavril, Ruano, Susana, Saugar, Elias

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Optical Characterization of AsxTe100−x Films Grown by Plasma Deposition Based on the Advanced Optimizing Envelope Method von Minkov, Dorian, Angelov, George, Nestorov, Radi, Nezhdanov, Aleksey, Usanov, Dmitry, Kudryashov, Mikhail, Mashin, Aleksandr

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NDE of degradation of thermal barrier coating by means of impedance spectroscopy von Ogawa, Kazuhiro, Minkov, Dorian, Shoji, Tetsuo, Sato, Minoru, Hashimoto, Hideo

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Study of crack inversions utilizing dipole model of a crack and Hall element measurements von Minkov, Dorian, Lee, Jinyi, Shoji, Tetsuo

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Optical Characterization of H-Free a-Si Layers Grown by rf-Magnetron Sputtering by Inverse Synthesis Using Matlab: Tauc–Lorentz–Urbach Parameterization von Márquez, Emilio, Ruíz-Pérez, Juan J., Ballester, Manuel, Márquez, Almudena P., Blanco, Eduardo, Minkov, Dorian, Ruano, Susana M. Fernández, Saugar, Elias

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Application of the Holomorphic Tauc-Lorentz-Urbach Function to Extract the Optical Constants of Amorphous Semiconductor Thin Films von Ballester, Manuel, García, Marcos, Márquez, Almudena P., Blanco, Eduardo, Fernández, Susana M., Minkov, Dorian, Katsaggelos, Aggelos K., Cossairt, Oliver, Willomitzer, Florian, Márquez, Emilio

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Development of algorithm for computer drawing envelopes of interference reflectance spectra for thin film specimens von Minkov, Dorian Asenov, Gavrilov, Gavril Mihaylov, Marquez, Emilio, Ruano, Susana Maria Fernandez, Stoynova, Anna Vladova

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Measurement of angular distribution of soft X-ray radiation from thin targets in the tabletop storage ring MIRRORCLE-20SX von Yamada, Hironari, Minkov, Dorian, Shimura, Yuki, Scourtis, Chris, Ejike, Okoye Kenneth, Hasegawa, Daisuke, Yamada, Mami, Hanashima, Takayasu, Atkinson, Ken

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EUV and soft X-ray transition radiation from MIRRORCLE-type tabletop synchrotrons von Toyosugi, Norio, Minkov, Dorian, Yamada, Hironari

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Computation of the optical constants of a thin dielectric layer on a transmitting substrate from the reflection spectrum at inclined incidence of light von Minkov, Dorian

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Novel NDI by Use of Magneto-Optical Film von LEE, Jinyi, SHOJI, Tetsuo, MINKOV, Dorian, ISHIHARA, Michiaki

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25aYS-7 Experimental Study of transition Radiation using 20MeV electron beam von Yamaguchi, T., Minkov, Dorian, Toyosugi, N., Yamada, H., Takashima, T.

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Novel NDI by Use of Magneto-Optical Film von LEE, Jinyi, SHOJI, Tetsuo, MINKOV, Dorian, ISHIHARA, Michiaki

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27aXD-10 MIRRORCLE20SX : Strong Soft X ray generator von Toyosugi, Norio, Yamada, Hironari, Deok, Ro. Young, Hasegawa, Daisuke, Hayashi, Taichi, Minkov, Dorian, Yamaguchi, Toshihiro

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27aXD-10 みらくる20SX : 大強度軟X線源(27aXD X線,粒子線(X線),領域10(誘電体,格子欠陥,X線・粒子線,フォノン物性)) von 豊杉, 典生, 山田, 廣成, 盧, 栄徳, 長谷川, 大祐, 林, 太一, 山口, 敏弘

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25aYS-7 みらくるを用いた遷移放射実験(X線・粒子線(X線),領域10(誘電体, 格子欠陥, X線・粒子線, フォノン物性)) von 山口, 敏弘, 豊杉, 典生, 山田, 廣成, 高島, 卓也

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