A Focused Ultrasoft X-Ray Microbeam for Targeting Cells Individually with Submicrometer Accuracy von Folkard, M., Schettino, G., Vojnovic, B., Gilchrist, S., Michette, A. G., Pfauntsch, S. J., Prise, K. M., Michael, B. D.

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Applications of wavelet analysis to study growth characteristics of x-ray multilayer mirrors von Jiang, H, Michette, A G, Pfauntsch, S J, Wang, Z S, Li, D H

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Broad angular multilayer analyzer for soft X-rays von Wang, Z S, Wang, H C, Zhu, J T, Wang, F L, Gu, Z X, Chen, L Y, Michette, A G, Powell, A K, Pfauntsch, S J, Schäfers, F

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A novel MOEMS based adaptive optics for X-ray focusing von Al Aioubi, M.Y., Prewett, P.D., Huq, S.E., Djakov, V., Michette, A.G.

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Micro-opto-electro-mechanical system for X-ray focusing von Al-Aioubi, M., Prewett, P.D., Huq, S.E., Djakov, V., Michette, A.G.

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Examination of the penetration of polymeric methylene di-phenyl-di-isocyanate (pMDI) into wood structure using chemical-state X-ray microscopy von BUCKLEY, C. J, PHANOPOULOS, C, KHALEQUE, N, ENGELEN, A, HOLWILL, M. E. J, MICHETTE, A. G

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Laser plasma x-ray line spectra fitted using the Pearson VII function von Michette, A G, Pfauntsch, S J

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Confinement-induced structural changes of water studied by Raman scattering von Erko, M., Findenegg, G. H., Cade, N., Michette, A. G., Paris, O.

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Nanometer focusing of X-rays with modified reflection zone plates von Michette, A.G., Pfauntsch, S.J., Erko, A., Firsov, A., Svintsov, A.

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Soft x-ray spectromicroscopy of wood fibre composites von Michette, A G, Phanopoulos, C, Newell, R J, McFaul, C, Pfauntsch, S J, Pans, G, Wirick, S

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X-ray microscopy von Michette, A G

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A new e-beam method for grey scale 3D optical elements von Kudryashov, V.A., Prewett, P.D., Michette, A.G.

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A simple new method for the investigation of process latitude in E-beam lithography with positive resists von Kudryashov, V.A., Prewett, P.D., Michette, A.G.

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Smart X-ray optics von Michette, A G, Pfauntsch, S J, Sahraei, S, Shand, M, Morrison, G R, Hart, D, Vojnovic, B, Stevenson, T, Parkes, W, Dunare, C, Willingale, R, Feldman, C, Button, T, Zhang, D, Rodriguez-Sanmartin, D, Wang, H

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A scanned source X-ray microscope von Michette, A G, Fedosejevs, R, Pfauntsch, S J, Bobkowski, R

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Low voltage e-beam irradiation: a new tool for suppression of airborne contamination effects in positive chemically amplified resists von Kudryashov, V.A., Prewett, P.D., Michette, A.G.

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Scanning x‐ray microscopy using a laser‐plasma source von Michette, A. G., Turcu, I. C. E., Schulz, M. S., Browne, M. T., Morrison, G. R., Fluck, P., Buckley, C. J., Foster, G. F.

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Toroidal condenser optics for dark-field X-ray microscopy von Pfauntsch, S.J, Michette, A.G, Buckley, C.J

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Reflectivity and Roughness of X-ray Multilayer Mirrors. Specular Reflection and Angular Spectrum of Scattered Radiation von Andreev, A.V., Michette, A.G., Renwick, A.

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Understanding Radiation Damage to Cells Using Microbeams von Folkard, M., Prise, K.M, Shao, C., Gilchrist, S., Schettino, G., Michette, A.G, Vojnovic, B.

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