Thermal Atomic Layer Etching of Aluminum Oxide (Al2O3) Using Sequential Exposures of Niobium Pentafluoride (NbF5) and Carbon Tetrachloride (CCl4): A Combined Experimental and Densi... von Sharma, Varun, Elliott, Simon D, Blomberg, Tom, Haukka, Suvi, Givens, Michael E, Tuominen, Marko, Ritala, Mikko

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Internal State: Dynamic, Interconnected Communication Loops Distributed Across Body, Brain, and Time von Kanwal, Jessleen K, Coddington, Emma, Frazer, Rachel, Limbania, Daniela, Turner, Grace, Davila, Karla J, Givens, Michael A, Williams, Valarie, Datta, Sandeep Robert, Wasserman, Sara

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Evaluation of soil-structure interaction effects from system identification of structures subject to forced vibration tests von Star, Lisa M., Tileylioglu, Salih, Givens, Michael J., Mylonakis, George, Stewart, Jonathan P.

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Modular analytical solutions for foundation damping in soil-structure interaction applications von Givens, Michael J, Mylonakis, George, Stewart, Jonathan P

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Combining Experimental and DFT Investigation of the Mechanism Involved in Thermal Etching of Titanium Nitride Using Alternate Exposures of NbF5 and CCl4, or CCl4 Only von Sharma, Varun, Kondati Natarajan, Suresh, Elliott, Simon D., Blomberg, Tom, Haukka, Suvi, Givens, Michael E., Tuominen, Marko, Ritala, Mikko

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Field-Testing of Structure on Shallow Foundation to Evaluate Soil-Structure Interaction Effects von Star, Lisa M, Givens, Michael J, Nigbor, Robert L, Stewart, Jonathan P

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Temperature dependence of frequency dispersion in III–V metal-oxide-semiconductor C-V and the capture/emission process of border traps von Vais, Abhitosh, Lin, Han-Chung, Dou, Chunmeng, Martens, Koen, Ivanov, Tsvetan, Xie, Qi, Tang, Fu, Givens, Michael, Maes, Jan, Collaert, Nadine, Raskin, Jean-Pierre, DeMeyer, Kristin, Thean, Aaron

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Sams teach yourself Adobe AIR programming in 24 hours von Givens, Michael Tyler

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Adobe® Apollo in Flight von Michael Givens

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Low-Temperature Dechlorosilylation Chemistry for Area-Selective Deposition of Ge2Sb2Te5 and Its Mechanism in Nanopatterns von Sinha, Jyoti, Gallis, Leonidas, Clerix, Jan-Willem J., van der Veen, Marleen, Innocent, Jerome, Illiberi, Andrea, Givens, Michael, Nyns, Laura, Delabie, Annelies

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Low Temperature Selective Epitaxy of Group-IV Semiconductors for Nanoelectronics von Khazaka, Rami, Marozas, Brendan, Kim, Wonjong, Givens, Michael

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Low-Temperature Dechlorosilylation Chemistry for Area-Selective Deposition of Ge 2 Sb 2 Te 5 and Its Mechanism in Nanopatterns von Sinha, Jyoti, Gallis, Leonidas, Clerix, Jan-Willem J., van der Veen, Marleen, Innocent, Jerome, Illiberi, Andrea, Givens, Michael, Nyns, Laura, Delabie, Annelies

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Low-Temperature Dechlorosilylation Chemistry for Area-Selective Deposition of Ge2Sb2Te5 and Its Mechanism in Nanopatterns von Sinha, Jyoti, Gallis, Leonidas, Clerix, Jan-Willem J, van der Veen, Marleen, Innocent, Jerome, Illiberi, Andrea, Givens, Michael, Nyns, Laura, Delabie, Annelies

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Thermal gas-phase etching of titanium nitride (TiN) by thionyl chloride (SOCl2) von Sharma, Varun, Blomberg, Tom, Haukka, Suvi, Cembella, Shaun, Givens, Michael E., Tuominen, Marko, Odedra, Rajesh, Graff, Wes, Ritala, Mikko

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Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices von Grossi, Alessandro, Perez, Eduardo, Zambelli, Cristian, Olivo, Piero, Miranda, Enrique, Roelofs, Robin, Woodruff, Jacob, Raisanen, Petri, Li, Wei, Givens, Michael, Costina, Ioan, Schubert, Markus Andreas, Wenger, Christian

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New Mechanisms for Ozone-Based ALD Growth of High-k Dielectrics via Nitrogen-Oxygen Species von Jung, Sung-Hoon, Raisanen, Petri, Givens, Michael, Shero, Eric, Delabie, A., Swerts, Johan, Van Elshocht, S., Willem Maes, Jan

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Extensive assessment of the charge-trapping kinetics in InGaAs MOS gate-stacks for the demonstration of improved BTI reliability von Putcha, Vamsi, Franco, Jacopo, Vais, Abhitosh, Kaczer, Ben, Xie, Qi, Maes, Jan Willem, Tang, Fu, Givens, Michael, Collaert, Nadine, Linten, Dimitri, Groeseneken, Guido

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Extensive assessment of the charge-trapping kinetics in InGaAs MOS gate-stacks for the demonstration of improved BTI reliability von Putcha, Vamsi, Franco, Jacopo, Vais, Abhitosh, Kaczer, Ben, Xie, Qi, Maes, Jan Willem, Tang, Fu, Givens, Michael, Collaert, Nadine, Linten, Dimitri, Groeseneken, Guido

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Adobe AIR Programming Unleashed von Givens, Michael, Gianninas, Dimitrios, Young, Stacy

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Combining Experimental and DFT Investigation of the Mechanism Involved in Thermal Etching of Titanium Nitride Using Alternate Exposures of NbF 5 and CCl 4 , or CCl 4 Only von Sharma, Varun, Kondati Natarajan, Suresh, Elliott, Simon D., Blomberg, Tom, Haukka, Suvi, Givens, Michael E., Tuominen, Marko, Ritala, Mikko

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