Backscattered electron imaging and scanning transmission electron microscopy imaging of multi-layers von Merli, P.G, Morandi, V, Corticelli, F

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Optimization of the performance of CVD diamond electron multipliers von Trucchi, D.M., Scilletta, C., Cappelli, E., Merli, P.G., Zoffoli, S., Mattei, G., Ascarelli, P.

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Effects of beam-specimen interaction on the observation of reverse-biased p-n junctions by electron interferometry von FAZZINI, P. F, MERLI, P. G, POZZI, G, UBALDI, F

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Electron microscope calibration for the Lorentz mode von Fazzini, P.F., Merli, P.G., Pozzi, G.

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Images of dopant profiles in low-energy scanning transmission electron microscopy von Merli, P. G., Corticelli, F., Morandi, V.

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Spatial resolution and energy filtering of backscattered electron images in scanning electron microscopy von Merli, P.G, Migliori, A, Morandi, V, Rosa, R

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New approach to study melting processes in metal nanoparticles: capacitance measurements von Parravicini, G. B., Stella, A., Ungureanu, M. C., Merli, P. G., Migliori, A., Kofman, R.

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About the role of boundary conditions on compositional imaging with a scanning electron microscope von MERLI, P. G., MORANDI, V., CORTICELLI, F.

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Effects of Ta/Nb-doping on titania-based thin films for gas-sensing von Comini, E., Ferroni, M., Guidi, V., Vomiero, A., Merli, P.G., Morandi, V., Sacerdoti, M., Mea, G. Della, Sberveglieri, G.

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Phase transitions in gallium nanodroplets detected by dielectric spectroscopy von PARRAVICINI, G. B, STELLA, A, UNGUREANU, M. C, MERLI, P. G, MIGLIORI, A, CHEYSSAC, P, KOFMAN, R

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Electrical and holographic characterization of gold catalyzed titania-based layers von Ortolani, L., Comini, E., Fazzini, P.F., Ferroni, M., Guidi, V., Merli, P.G., Morandi, V., Pozzi, G., Sberveglieri, G., Vomiero, A.

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Resolution of superlattice structures with backscattered electrons in a scanning electron microscope von Merli, P.G., Nacucchi, M.

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Scanning electron microscopy of dopant distribution in semiconductors von Merli, P. G., Morandi, V., Savini, G., Ferroni, M., Sberveglieri, G.

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Electron holography study of voids in self-annealed implanted silicon von Beeli, C.

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On the resolution of semiconductor multilayers with a scanning electron microscope von Merli, P.G, Migliori, A, Nacucchi, M, Govoni, D, Mattei, G

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Insight into the premelting and melting processes of metal nanoparticles through capacitance measurements von Parravicini, G. B., Stella, A., Tognini, P., Merli, P. G., Migliori, A., Cheyssac, P., Kofman, R.

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Comparison of spatial resolutions obtained with different signal components in scanning electron microscopy von Merli, P.G., Migliori, A., Nacucchi, M., Vittori Antisari, M.

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Secondary electron emission from diamond: Physical modeling and application to scanning electron microscopy von Ascarelli, P., Cappelli, E., Pinzari, F., Rossi, M. C., Salvatori, S., Merli, P. G., Migliori, A.

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Solid-phase epitaxy of implanted silicon at liquid nitrogen and room temperature induced by electron irradiation in the electron microscope von Corticelli, F., Lulli, G., Merli, P. G.

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Characterization of defects produced during self-annealing implantation of As in silicon von LULLI, G, MERLI, P. G, MIGLIORI, A, MATTEUCCI, G, STANGHELLINI, M

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