Metal Adsorption Controls Stability of Layered Manganese Oxides von Yang, Peng, Post, Jeffrey E, Wang, Qian, Xu, Wenqian, Geiss, Roy, McCurdy, Patrick R, Zhu, Mengqiang

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Nitric Acid−Water Complexes:  Theoretical Calculations and Comparison to Experiment von McCurdy, Patrick R, Hess, Wayne P, Xantheas, Sotiris S

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Studies of Electrochemically Transformed Ferritin Adsorbed at Tin-Doped Indium Oxide Electrodes Using X-ray Photoelectron Spectroscopy von Martin, Kevin C, Villano, Stephanie M, McCurdy, Patrick R, Zapien, Donald C

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Surface Interactions of NH2 Radicals in NH3 Plasmas von McCurdy, Patrick R, Butoi, Carmen I, Williams, Keri L, Fisher, Ellen R

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Investigation of the PECVD TiO 2–Si(1 0 0) interface von McCurdy, Patrick R, Sturgess, Laura J, Kohli, Sandeep, Fisher, Ellen R

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Investigation of the PECVD TiO2-Si(1 0 0) interface von MCCURDY, Patrick R, STURGESS, Laura J, KOHLI, Sandeep, FISHER, Ellen R

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Isoelectric points of plasma-modified and aged silicon oxynitride surfaces measured using contact angle titrations von Trevino, Kristina J., Shearer, Jeffrey C., McCurdy, Patrick R., Pease-Dodson, Shannon E., Okegbe, Christabel C., Fisher, Ellen R.

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Effect of Annealing on the Interfacial and Structural Properties of Amorphous Silicon-Hafnia Films von Kohli, Sandeep, McCurdy, Patrick R., Rithner, Christopher D., Dorhout, Peter K., Dummer, Ann M., Menoni, Carmen S.

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Spectroscopic ellipsometry and photoluminescence measurements of as-deposited and annealed silicon rich oxynitride films von Kohli, Sandeep, Theil, Jeremy A., McCurdy, Patrick R., Dippo, Patricia C., Ahrenkiel, Richard K., Rithner, Christopher D., Dorhout, Peter K.

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Surface Reactivity and Plasma Energetics of SiH Radicals during Plasma Deposition of Silicon-Based Materials von Kessels, W. M. M, McCurdy, Patrick R, Williams, Keri L, Barker, G. R, Venturo, Vincent A, Fisher, Ellen R

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Effect of Chemical Treatment on the Optical Properties of a Cadmium Telluride Photovoltaic Device Investigated by Spectroscopic Ellipsometry von Kohli, Sandeep, Manivannan, Venkatesan, Hilfiker, James N, McCurdy, Patrick R, Enzenroth, Robert A, Barth, Kurt L, Smith, Westcott P, Luebs, Richard, Sampath, Walajabad S

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Template-Assisted Chemical Vapor Deposited Spinel Ferrite Nanotubes von Kohli, Sandeep, McCurdy, Patrick R., Johnson, Derek C., Das, Jaydip, Prieto, Amy L., Rithner, Christopher D., Fisher, Ellen R.

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Pulsed and continuous wave plasma deposition of amorphous, hydrogenated silicon carbide from SiH4/CH4 plasmas von McCurdy, Patrick R., Truitt, Jason M., Fisher, Ellen R.

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Comparison of Oxidation Rates for a ‐ Si1 − x  C  x  :  H  Films Deposited from Pulsed and Continuous Wave RF Plasmas von McCurdy, Patrick R., Truitt, Jason M., Fisher, Ellen R.

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Microstructural features of cadmium telluride photovoltaic thin film devices von Manivannan, Venkatesan, Enzenroth, Robert A., Barth, Kurt L., Kohli, Sandeep, McCurdy, Patrick R., Sampath, Walajabad S.

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Microstmctural features of cadmium telluride photovoltaic thin film devices von MANIVANNAN, Venkatesan, ENZENROTH, Robert A, BARTH, Kurt L, KOHLI, Sandeep, MCCURDY, Patrick R, SAMPATH, Walajabad S

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X-ray characterization of oriented β-tantalum films von Kohli, Sandeep, McCurdy, Patrick R., Rithner, Christopher D., Dorhout, Peter K., Dummer, Ann M., Brizuela, Fernando, Menoni, Carmen S.

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A modified molecular beam instrument for the imaging of radicals interacting with surfaces during plasma processing von McCurdy, Patrick R., Bogart, K. H. A., Dalleska, N. F., Fisher, Ellen R.

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Ultraviolet photochemistry of hydrogen-bonded HBr⋅acetone complexes in argon matrices von McCurdy, Patrick R., Vorpagel, Erich R., Hess, Wayne P.

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Effect of chemical treatment on the optical properties of a cdte photovoltaic device investigated by spectroscopic ellipsometry von Kohli, S, Manivannan, V, Hilfiker, J N, McCurdy, P R, Enzenroth, R A, Barth, K L, Smith, W P, Luebs, R, Kephart, J, Sampath, W S

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