Gene expression profiling identifies different sub-types of retinoblastoma von Kapatai, G, Brundler, M-A, Jenkinson, H, Kearns, P, Parulekar, M, Peet, A C, McConville, C M

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Mullite formation in clays and clay-derived vitreous ceramics von Lee, W.E., Souza, G.P., McConville, C.J., Tarvornpanich, T., Iqbal, Y.

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Reaction of atomic oxygen with a Pt( [formula omitted]) surface: chemical and structural determination using XPS, CAICISS and LEED von Parkinson, C.R, Walker, M, McConville, C.F

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Intrinsic electron accumulation at clean InN surfaces von Mahboob, I, Veal, T D, McConville, C F, Lu, H, Schaff, W J

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Surface electron accumulation and the charge neutrality level in In2O3 von King, P D C, Veal, T D, Payne, D J, Bourlange, A, Egdell, R G, McConville, C F

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Temperature dependence of the direct bandgap and transport properties of CdO von Vasheghani Farahani, S. K., Muñoz-Sanjosé, V., Zúñiga-Pérez, J., McConville, C. F., Veal, T. D.

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A multilevel study of brand-specific transformational leadership: employee and customer effects von Chiang, Hsu-Hsin, Han, Tzu-Shian, C. McConville, David

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Revisiting the origin of satellites in core-level photoemission of transparent conducting oxides: The case of n-doped SnO2 von Borgatti, Francesco, Berger, J A, Céolin, Denis, Zhou, Jianqiang Sky, Kas, Joshua J, Guzzo, Matteo, McConville, C F, Offi, Francesco, Panaccione, Giancarlo, Regoutz, Anna, Payne, David J, Rueff, Jean-Pascal, Bierwagen, Oliver, White, Mark E, Speck, James S, Gatti, Matteo, Egdell, Russell G

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SnTe microcrystals: Surface cleaning of a topological crystalline insulator von Saghir, M., Walker, M., McConville, C. F., Balakrishnan, G.

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Surface band-gap narrowing in quantized electron accumulation layers von King, P D C, Veal, T D, McConville, C F, Zúñiga-Pérez, J, Muñoz-Sanjosé, V, Hopkinson, M, Rienks, E D L, Jensen, M Fuglsang, Hofmann, Ph

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Valence-band electronic structure of CdO, ZnO, and MgO from x-ray photoemission spectroscopy and quasi-particle-corrected density-functional theory calculations von King, P. D. C., Veal, T. D., Schleife, A., Zúñiga-Pérez, J., Martel, B., Jefferson, P. H., Fuchs, F., Muñoz-Sanjosé, V., Bechstedt, F., McConville, C. F.

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Optimization of a High Work Function Solution Processed Vanadium Oxide Hole-Extracting Layer for Small Molecule and Polymer Organic Photovoltaic Cells von Hancox, I, Rochford, L. A, Clare, D, Walker, M, Mudd, J. J, Sullivan, P, Schumann, S, McConville, C. F, Jones, T. S

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Origin of electron accumulation at wurtzite InN surfaces von MAHHOOB, I, VEAL, T. D, PIPER, L. F. J, MCCONVILLE, C. F, HAI LU, SCHAFF, W. J, FURTHMÜLLER, J, BECHSTEDT, F

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Low temperature removal of surface oxides and hydrocarbons from Ge(100) using atomic hydrogen von Walker, M., Tedder, M.S., Palmer, J.D., Mudd, J.J., McConville, C.F.

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Giant reduction of InN surface electron accumulation: compensation of surface donors by Mg dopants von Linhart, W M, Chai, J, Morris, R J H, Dowsett, M G, McConville, C F, Durbin, S M, Veal, T D

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Surface Structure and Electronic Properties of In2O3(111) Single-Crystal Thin Films Grown on Y-Stabilized ZrO2(111) von Zhang, K. H. L, Payne, D.J, Palgrave, R. G, Lazarov, V. K, Chen, W, Wee, A. T. S, McConville, C. F, King, P. D. C, Veal, T. D, Panaccione, G, Lacovig, P, Egdell, R. G

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Thickness dependence of the strain, band gap and transport properties of epitaxial In2O3 thin films grown on Y-stabilised ZrO2(111) von Zhang, K H L, Lazarov, V K, Veal, T D, Oropeza, F E, McConville, C F, Egdell, R G, Walsh, A

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Microstructural Development on Firing Illite and Smectite Clays Compared with that in Kaolinite von McConville, Caspar J., Lee, William Edward

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Quantized electron accumulation states in indium nitride studied by angle-resolved photoemission spectroscopy von Colakerol, Leyla, Veal, T D, Jeong, Hae-Kyung, Plucinski, Lukasz, DeMasi, Alex, Learmonth, Timothy, Glans, Per-Anders, Wang, Shancai, Zhang, Yufeng, Piper, L F J, Jefferson, P H, Fedorov, Alexei, Chen, Tai-Chou, Moustakas, T D, McConville, C F, Smith, Kevin E

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Structural, electrical and optical characterization of MOCVD grown In-rich InGaN layers von Tuna, Ö., Linhart, W.M., Lutsenko, E.V., Rzheutski, M.V., Yablonskii, G.P., Veal, T.D., McConville, C.F., Giesen, C., Kalisch, H., Vescan, A., Heuken, M.

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