7 × 7 Si(111)Cu interfaces: Combined LEED, AES and EELS measurements von Daugy, E., Mathiez, P., Salvan, F., Layet, J.M.

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Dynamics of laser annealing of amorphous Ge and GaAs films by the transient grating method von Marine, W., Mathiez, P.

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Quasielastic light-scattering study of polyadenylic acid solutions. II von Mathiez, P., Mouttet, C., Weisbuch, G.

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Combined AES, LEED, SEM and TEM characterizations of CuSi(100) interfaces von Hanbücken, M., Métois, J.J., Mathiez, P., Salvan, F.

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Characterization of Cu/Si(100) interfaces by different surface-sensitive techniques von Mathiez, P., Daugy, E., Salvan, F., Metois, J.J., Hanbücken, M.

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CuSi(111) interfaces: Oxidation properties in relation with their structural properties von Daugy, E., Mathiez, P., Salvan, F., Layet, J.M., Derrien, J.

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Inelastic light-scattering study of polyadenilic acid von Mathiez, P., Weisbuch, G., Mouttet, C.

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Structure of the Au/Si(111) surface by scanning tunneling microscopy von Dumas, Ph, Humbert, A, Mathieu, G, Mathiez, P, Mouttet, C, Rolland, R, Salvan, F, Thibaudau, F, Tosch, S

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Cooperative Segregation of Boron at Si(111) von Thibaudau, F, Roge, T. P, Mathiez, Ph, Dumas, Ph, Salvan, F

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A STM study on compared chemical reactivities of different Si(111) surfaces: copper growth and ferrocene adsorption von Thibaudau, F., Roge, T.P., Roche, J.R., Mathiez, Ph, Dumas, Ph, Salvan, F.

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Reactively sputtered zirconium carbides, carbonitrides and nitrides thin films-optical properties von Bonnot, A.M., Belkhir, H., Pailharey, D., Mathiez, P.

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Scanning tunneling microscopy investigations on Pb/Si(111) von Palmino, F., Dumas, Ph, Mathiez, Ph, Mouttet, C., Salvan, F., Köhler, U.

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Combined AES, LEED, SEM, and TEM characterization of Cu-Si(100) interfaces von Hanbuecken, M, Metois, J J, Mathiez, P

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Scanning Tunneling Microscopy Investigations on Pb/Si(111) von Palmino, F, Dumas, P, Mathiez, P, Mouttet, C, Salvan, F, Kohler, U

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Early stages of Cu growth on B-Si(111)√3×√3R30 von MATHIEZ, P, ROGE, T. P, DUMAS, P, SALVAN, F

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7 x 7 Silicon (111)--Cu Interfaces: Combined LEED, AES and EELS Measurements von Daugy, E, Mathiez, P, Salvan, F, Layet, J M

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Cu--Si(111) Interfaces: Oxidation Properties in Relation With Their Structural Properties von Daugy, E, Mathiez, P, Salvan, F, Layet, J M, Derrien, J

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Characterization of Cu/Si(100) interfaces by different surface-sensitive techniques von Mathiez, P., Daugy, E., Salvan, F.

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Scanning probe methods and near field microscopies von DUMAS, P, MATHIEZ, P, PORTE, LOUIS, SAINT-JEAN, G, SALVAN, FRANCK, THIBAUDAU, F

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Combined AES, LEED, SEM and TEM characterizations of Cu−Si(100) interfaces von Hanbücken, M., Métois, J.J., Mathiez, P., Salvan, F.

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