A Semi-empirical Bayesian Chart to Monitor Weibull Percentiles von Erto, Pasquale, Pallotta, Giuliana, Mastrangelo, Christina M.

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MRI log file analysis for workflow improvement von Petroianu, Larissa P.G., Li, Lun, Mieloszyk, Rebecca J., Mastrangelo, Christina M., Stapleton, Shawn, Hall, Christopher

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Systems Modeling Approach for Reducing the Risk of Healthcare-Associated Infections von Limaye, Shreyas S., Mastrangelo, Christina M.

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Classification of Defect Clusters on Semiconductor Wafers Via the Hough Transformation von White, K. Preston, Kundu, Bijoy, Mastrangelo, Christina M.

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Improving Weibull distribution estimation for generalized Type I censored data using modified SMOTE von Starling, James K., Mastrangelo, Christina, Choe, Youngjun

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Application of Generalized Linear Models to Predict Semiconductor Yield Using Defect Metrology Data von Krueger, D C, Montgomery, D C, Mastrangelo, C M

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A risk-based approach to forecasting component obsolescence von Mastrangelo, Christina M., Olson, Kara A., Summers, Dennis M.

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Identifying DMSMS availability risk at the system level von Starling, James K., Choe, Youngjun, Mastrangelo, Christina

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Model selection for degradation-based Bayesian reliability analysis von Li, Zhaojun, Deng, Yiming, Mastrangelo, Christina

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A Statistical Approach to Reduce Hospital-Associated Infections von Limaye, Shreyas S., Mastrangelo, Christina M., Zerr, Danielle M., Jeffries, Howard

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A Case Study in Monitoring Hospital-Associated Infections with Count Control Charts von Limaye, Shreyas S., Mastrangelo, Christina M., Zerr, Danielle M.

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Designing a parameter‐free Kullback‐Leibler information control chart for monitoring process mean shift von Chang, Yu‐Ching, Li, Ting‐Wei, Mastrangelo, Christina

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Parameter Selection for a Robust Tracking Signal von Brence, John R., Mastrangelo, Christina M.

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An Empirical Comparison of Spatial Randomness Models for Yield Analysis von Fellows, H.H., Mastrangelo, C.M., White, K.P.

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Hierarchical modeling using generalized linear models von Kumar, Naveen, Mastrangelo, Christina, Montgomery, Doug

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Manufacturing of Smart Goods: Current State, Future Potential, and Research Recommendations von Paul, Brian K, Panat, Rahul, Mastrangelo, Christina, Kim, Dave, Johnson, David

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Addressing multicollinearity in semiconductor manufacturing von Chang, Yu‐Ching, Mastrangelo, Christina

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Comparing Multi-response Design Methods with Mixed Responses von Kros, John F., Mastrangelo, Christina M.

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Comparing methods for the multi-response design problem von Kros, John F., Mastrangelo, Christina M.

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Statistical process monitoring with principal components von Mastrangelo, Christina M., Runger, George C., Montgomery, Douglas C.

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