An adapted method for analyzing 4H silicon carbide metal-oxide-semiconductor field-effect transistors von Hauck, Martin, Lehmeyer, Johannes, Pobegen, Gregor, Weber, Heiko B., Krieger, Michael

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Structural fluctuations cause spin-split states in tetragonal (CH 3 NH 3 )PbI 3 as evidenced by the circular photogalvanic effect von Niesner, Daniel, Hauck, Martin, Shrestha, Shreetu, Levchuk, Ievgen, Matt, Gebhard J, Osvet, Andres, Batentschuk, Miroslaw, Brabec, Christoph, Weber, Heiko B, Fauster, Thomas

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Structural fluctuations cause spin-split states in tetragonal (CH₃NH₃)PbI₃ as evidenced by the circular photogalvanic effect von Niesner, Daniel, Hauck, Martin, Shrestha, Shreetu, Levchuk, Ievgen, Matt, Gebhard J., Osvet, Andres, Batentschuk, Miroslaw, Brabec, Christoph, Weber, Heiko B., Fauster, Thomas

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Persistent Conductivity in n-Type 3C-SiC Observed at Low Temperatures von Fromm, Felix, Beljakowa, Svetlana, Hauck, Martin, Bockstedte, Michel, Krieger, M., Hundhausen, Martin, Weber, Heiko B., Nagasawa, Hiroyuki, Pensl, Gerhard

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Attosecond-fast internal photoemission von Heide, Christian, Hauck, Martin, Higuchi, Takuya, Ristein, Jürgen, Ley, Lothar, Weber, Heiko B., Hommelhoff, Peter

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Dependence of the Channel Mobility in 3C-SiC n-MOSFETs on the Crystal Orientation and Channel Length von Beljakowa, Svetlana, Hauck, Martin, Zippelius, Bernd, Uchida, Hidetsugu, Krieger, M., Schöner, Adolf, Weber, Heiko B., Nagasawa, Hiroyuki, Pensl, Gerhard

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On the origin of drain current transients and subthreshold sweep hysteresis in 4H-SiC MOSFETs von Rasinger, Fabian, Hauck, Martin, Rescher, Gerald, Aichinger, Thomas, Weber, Heiko B., Krieger, Michael, Pobegen, Gregor

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Structural fluctuations cause spin-split states in tetragonal (CH^sub 3^NH^sub 3^)PbI^sub 3^ as evidenced by the circular photogalvanic effect von Niesner, Daniel, Hauck, Martin, Shrestha, Shreetu, Levchuk, Ievgen, Matt, Gebhard J, Osvet, Andres, Batentschuk, Miroslaw, Brabec, Christoph, Weber, Heiko B, Fauster, Thomas

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On the Origin of Charge Compensation in Aluminum-Implanted n-Type 4H-SiC by Analysis of Hall Effect Measurements von Weisse, Julietta, Sledziewski, Tomasz, Krieger, Michael, Bauer, Anton J., Mitlehner, Heinz, Frey, Lothar, Erlbacher, Tobias, Hauck, Martin

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Analysis of Compensation Effects in Aluminum-Implanted 4H-SiC Devices von Weisse, Julietta, Sledziewski, Tomasz, Frey, Lothar, Tschiesche, Mattias, Krieger, Michael, Mitlehner, Heinz, Erlbacher, Tobias, Hauck, Martin, Bauer, Anton J.

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On the Origin of Threshold Voltage Instability under Operating Conditions of 4H-SiC n-Channel MOSFETs von Weber, Heiko B., Pobegen, Gregor, Hauck, Martin, Weisse, Julietta, Krieger, M.

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Quantitative investigation of near interface traps in 4H-SiC MOSFETs via drain current deep level transient spectroscopy von Hauck, M., Weisse, J., Lehmeyer, J., Pobegen, G., Weber, H. B., Krieger, M.

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M. Martini Haucken, Weiland Schul-Rectoris zu Colditz, Zodiacus scholasticus, oder, Schul-Buch : darin[n]e nach Anleitung der zwölff Himmels-Zeichen auff emblematische Art, der Sch... von Hauck, Martin

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Attosecond-fast internal photoemission von Heide, Christian, Hauck, Martin, Higuchi, Takuya, Ristein, Jürgen, Ley, Lothar, Weber, Heiko B, Hommelhoff, Peter

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Wasserlösliches Supportmaterial für den 3D-Druck, AZ 31437 von Hauck, Martin

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Packaging for frozen or refrigerated products, in particular ice cream von AGATA SURDZIEL, MARTIN HAUCK

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Spin-split bands cause the indirect band gap of (CH$_3$NH$_3$)PbI$_3$: Experimental evidence from circular photogalvanic effect von Niesner, Daniel, Hauck, Martin, Shrestha, Shreetu, Levchuk, Ievgen, Matt, Gebhard J, Osvet, Andres, Batentschuk, Miroslaw, Brabec, Christoph, Weber, Heiko B, Fauster, Thomas

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PRESSURE SENSOR FOR AN AIR-CONDITIONING SYSTEM von KREMPEL, Sandro, RIENECKER, Maik, STÜTZE, Nicole, REISER, Michael, HAUCK, Martin, WOLNY, Claudia, SCHMITT, Hans-Michael

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Packaging for frozen or refrigerated products, in particular ice cream von AGATA SURDZIEL, MARTIN HAUCK

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PACKAGING FOR FROZEN OR REFRIGERATED PRODUCTS, IN PARTICULAR ICE CREAM von SURDZIEL, AGATA, HAUCK, MARTIN

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