High efficiency CSS CdTe solar cells von Ferekides, C.S, Marinskiy, D, Viswanathan, V, Tetali, B, Palekis, V, Selvaraj, P, Morel, D.L

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Recent Progress in Non-Contact Electrical Characterization for SiC and Related Compounds von Wilson, Marshall, Schrayer, Bret, Almeida, Carlos, Savtchouk, Alexandre, Marinskiy, Dmitriy, Lagowski, Jacek

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Kelvin force microscopy characterization of corona charged dielectric surfaces von Marinskiy, D

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Model-Based Corona Charge - Kelvin Probe Characterization of Patterned Structures von Marinskiy, Dmitriy, Lagowski, Jacek

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Optimizing Non-Contact Doping and Electrical Defect Metrology for Production of SiC Epitaxial Wafers von Sanchez, Edward, Wilson, Marshall, Gave, Matthew, Rana, Tawhid, Lagowski, Jacek, Savtchouk, Alexandre, Marinskiy, Dmitriy, Pushkarev, Vladimir

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A Novel Approach to Measuring Doping in SiC by Micro Spot Corona-Kelvin Method von Savtchouk, Alexandre, Marinskiy, Dmitriy

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A Method for Effective Work Function Monitoring von Marinskiy, Dmitriy, Loy, Thye Chong, Edelman, Piotr, Lagowski, Jacek

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Application of Non-contact Corona-Kelvin metrology for Characterization of Plasma Nitrided SiO2 von Belyaev, A, Marinskiy, D, Wilson, M, D'Amico, J, Jastrzebski, L, Lagowski, J

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Ultra-High Sensitivity Surface Photovoltage Measurement of Heavy Metal Contamination in Silicon Wafers with Fast Metal Identification von Wilson, Marshall, Savtchouk, Alexandre, D'Amico, John, Schrayer, Bret, Marinskiy, Dmitriy, Edelman, Piotr, Almeida, Carlos, Zajac, Troy, Findlay, Andrew David, Lagowski, Jacek

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Non-contact C-V measurements of ultra thin dielectrics von Edelman, P., Savtchouk, A., Wilson, M., D'Amico, J., Kochey, J. N., Marinskiy, D., Lagowski, J.

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Kelvin Force Microscopy Characterization of Corona Charged Dielectric Surfaces von Marinskiy, D., Edelman, P., Snider, A.D.

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Measuring CET of High-k Dielectrics with Novel Kinetic Approach Using Micro-Site Corona - Kelvin Method von Marinskiy, Dmitriy, Loy, Thye Chong, Yeh, H. C., Wilson, Marshall, Lagowski, Jacek

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CdS: characterization and recent advances in CdTe solar cell performance von Ferekides, C., Marinskiy, D., Morel, D.L.

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CdS films prepared by the close-spaced sublimation and their influence on CdTe/CdS solar cell performance von Ferekides, C.S., Marinskiy, D., Marinskaya, S., Tetali, B., Oman, D., Morel, D.L.

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Full wafer non-contact mapping of electrical properties of ultra-thin advanced dielectrics on Si von Edelman, Piotr, Lagowski, Jacek, Savtchouk, Alexandre, Wilson, Marshall, Aleynikov, Andrey, Marinskiy, Dmitriy, Navarro, Joaquin

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Non-Contact Electrical Doping Profiling von Marinskiy, D, Lagowski, J, D'Amico, J, Findlay, A, Jastrzebski, L

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Non-Contact C-V Technique for high-k Applications von Edelman, Piotr, Savtchouk, Alexandre, Wilson, Marshall, D'Amico, John, Kochey, Joseph N, Marinskiy, Dmitriy, Lagowski, Jacek

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High efficiency CSS CdTe solar cells von FEREKIDES, C. S, MARINSKIY, D, VISWANATHAN, V, TETALI, B, PALEKIS, V, SELVARAJ, P, MOREL, D. L

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RESTORATION OF TENDONS, USING ELECTRIC WELDING — A NEW STEP IN TRAUMATOLOGY von Muzychenko, P F, Chernyak, V A, Marinskiy, G S, Volnyanskaya, E D

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Non-Visual Defect Monitoring with Surface Voltage Mapping: Application for Semiconductor IC and PV Technology von Findlay, Andrew, Wilson, Marshall, Edelman, Piotr, Almeida, Carlos, Marinskiy, Dmitriy, D'Amico, John, Lagowski, Jacek, Savtchouk, Alexandre

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