Characterization of rough surfaces with vibrated drops von BORMASHENKO, Edward, POGREB, Roman, STEIN, Tamir, WHYMAN, Gene, ERLICH, Mordechai, MUSIN, Albina, MACHAVARIANI, Vladimir, AURBACH, Doron

Volltext

Mesoscopic Patterning in Evaporated Polymer Solutions: Poly(ethylene glycol) and Room-Temperature-Vulcanized Polyorganosilanes/-siloxanes Promote Formation of Honeycomb Structures von Bormashenko, Edward, Malkin, Alexander, Musin, Albina, Bormashenko, Yelena, Whyman, Gene, Litvak, Natalya, Barkay, Zahava, Machavariani, Vladimir

Volltext

Mesoscopic Patterning in Evaporated Polymer Solutions: Poly(ethylene glycol) and Room-Temperature-Vulcanized Polyorganosilanes/-siloxanes Promote Formation of Honeycomb Structures von Bormashenko, Edward, Malkin, Alexander, Musin, Albina, Bormashenko, Yelena, Whyman, Gene, Litvak, Natalya, Barkay, Zahava, Machavariani, Vladimir

Volltext

Macromol. Chem. Phys. 6/2008 von Bormashenko, Edward, Malkin, Alexander, Musin, Albina, Bormashenko, Yelena, Whyman, Gene, Litvak, Natalya, Barkay, Zahava, Machavariani, Vladimir

Volltext

Raman spectroscopy based measurements in patterned structures von Barak, Gilad, Oren, Yonatan, Machavariani, Vladimir, Hainick, Yanir

Volltext bestellen

EVALUATION OF X-RAY SIGNALS FROM A PERTURBED OBJECT von POIS, Heath, GOV, Shahar, YACHINI, Michael Haim, LUND, Parker, MACHAVARIANI, Vladimir, KANDEL, Daniel

Volltext bestellen

Evaluation of x-ray signals from a perturbed object von POIS Heath, YACHINI Michael Haim, MACHAVARIANI Vladimir, GOV Shahar, KANDEL Daniel, LUND Parker

Volltext bestellen

SECONDARY ION MASS SPECTROMETRY ANALYSIS von POIS, Heath, HOFFMAN, Julia, SCHUELER, Bruno W, MACHAVARIANI, Vladimir, KANDEL, Daniel

Volltext bestellen

Evaluation of x-ray signals from a perturbed object von POIS Heath, YACHINI Michael Haim, MACHAVARIANI Vladimir, GOV Shahar, KANDEL Daniel, LUND Parker

Volltext bestellen

EVALUATION OF X-RAY SIGNALS FROM A PERTURBED OBJECT von POIS, Heath, GOV, Shahar, YACHINI, Michael Haim, LUND, Parker, MACHAVARIANI, Vladimir, KANDEL, Daniel

Volltext bestellen

Evaluation of x-ray signals from a perturbed object von POIS Heath, YACHINI Michael Haim, MACHAVARIANI Vladimir, GOV Shahar, KANDEL Daniel, LUND Parker

Volltext bestellen

TEM-based metrology method and system von Machavariani, Vladimir, Ziselman, Igor, Kandel, Daniel, Shifrin, Michael, Sendelbach, Matthew, Kucherov, Victor, Urenski, Ronen

Volltext bestellen

Metrology method and system von Machavariani, Vladimir, Ziselman, Igor, Kandel, Daniel, Shifrin, Michael, Sendelbach, Matthew, Kucherov, Victor, Urenski, Ronen

Volltext bestellen

Method and system for optical metrology in patterned structures von Barak, Gilad, Machavariani, Vladimir, Hainick, Yanir, Koret, Roy, Levant, Boris

Volltext bestellen

METHOD AND SYSTEM FOR OPTICAL METROLOGY IN PATTERNED STRUCTURES von Barak, Gilad, Machavariani, Vladimir, Hainick, Yanir, Koret, Roy, Levant, Boris

Volltext bestellen

TEM-BASED METROLOGY METHOD AND SYSTEM von KUCHEROV, VICTOR, URENSKI, RONEN, KANDEL, DANIEL, MACHAVARIANI, VLADIMIR, SENDELBACH, MATTHEW, ZISELMAN, IGOR, SHIFRIN, MICHAEL

Volltext bestellen

Method and system for optical metrology in patterned structures von Barak, Gilad, Machavariani, Vladimir, Hainick, Yanir, Koret, Roy, Levant, Boris

Volltext bestellen

TEM-based metrology method and system von Machavariani, Vladimir, Ziselman, Igor, Kandel, Daniel, Shifrin, Michael, Sendelbach, Matthew, Kucherov, Victor, Urenski, Ronen

Volltext bestellen

RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES von OREN, YONATAN, MACHAVARIANI, VLADIMIR, HAINICK, YANIR, BARAK, GILAD

Volltext bestellen

METHOD AND SYSTEM FOR OPTICAL METROLOGY IN PATTERNED STRUCTURES von MACHAVARIANI Vladimir, HAINICK Yanir, LEVANT Boris, KORET Roy, BARAK Gilad

Volltext bestellen