Reject inference in consumer credit scoring with nonignorable missing data von Bücker, Michael, van Kampen, Maarten, Krämer, Walter

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In situ ellipsometry study of atomic hydrogen etching of extreme ultraviolet induced carbon layers von Chen, Juequan, Louis, Eric, Harmsen, Rob, Tsarfati, Tim, Wormeester, Herbert, van Kampen, Maarten, van Schaik, Willem, van de Kruijs, Robbert, Bijkerk, Fred

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A simple nonparametric test for structural change in joint tail probabilities von Krämer, Walter, van Kampen, Maarten

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Corrigendum to “In situ ellipsometry study of atomic hydrogen etching of extreme ultraviolet induced carbon layers” [Appl. Surf. Sci. 258(1) (2011) 7–12] von Chen, Juequan, Louis, Eric, Harmsen, Rob, Tsarfati, Tim, Wormeester, Herbert, van Kampen, Maarten, van Schaik, Willem, van de Kruijs, Robbert, Bijkerk, Fred

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A fluctuation test for constant Spearman’s rho with nuisance-free limit distribution von Wied, Dominik, Dehling, Herold, van Kampen, Maarten, Vogel, Daniel

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Radical recombination sensor based on dual probe thermopile heat flux sensors von Velthuis, Johannes F. M., Storm, Arnold, van Kampen, Maarten, van der Horst, Ruud, Profijt, Harald B.

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Secondary electron yield measurements of carbon covered multilayer optics von Chen, Juequan, Louis, Eric, Verhoeven, Jan, Harmsen, Rob, Lee, Chris J., Lubomska, Monika, van Kampen, Maarten, van Schaik, Willem, Bijkerk, Fred

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A fluctuation test for constant Spearman's rho with nuisance-free limit distribution von Wied, Dominik, Herold Dehling, Maarten van Kampen, Vogel, Daniel

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A room-temperature electrical field-controlled magnetic memory cell von Cavaco, Cavaco, Van Kampen, Maarten, Lagae, Liesbet, Borghs, Gustaaf

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Magnetic and transport properties of Ni81Fe19∕Al2O3 granular multilayers approaching the superparamagnetic limit von Bručas, R., Hanson, M., Gunnarsson, R., Wahlström, E., van Kampen, M., Hjörvarsson, B., Lidbaum, H., Leifer, K.

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APPARATUS AND METHOD FOR CLEANING AN INSPECTION SYSTEM von Van Kampen, Maarten, Farokhipoor, Saeedeh, Nikipelov, Andrey

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Apparatus and method for cleaning an inspection system von Van Kampen, Maarten, Farokhipoor, Saeedeh, Nikipelov, Andrey

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Quantum Well States in Spin-Dependent Tunnel Structures von Moodera, Jagadeesh S., Nowak, Janusz, Kinder, Lisa R., Tedrow, Paul M., van de Veerdonk, René J. M., Smits, Bart A., van Kampen, Maarten, Swagten, Henk J. M., de Jonge, Wim J. M.

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METHODS AND SYSTEMS FOR DETERMINING A PROPERTY OF EUV RADIATION von BLAUW, Michiel, DE MUNSHI, Debashis, VAN KAMPEN, Maarten

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The influence of weak links on magnetic ordering in layered structures von Hjörvarsson, B, Kudasov, Yu, Wolff, M, Hase, T, Chacon, C, van Kampen, M, Nordblad, P, Liebig, A, Zabel, H

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APPARATUS AND METHOD FOR CLEANING AN INSPECTION SYSTEM von NIKIPELOV, Andrey, FAROKHIPOOR, Saeedeh, VAN KAMPEN, Maarten

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APPARATUS AND METHOD FOR CLEANING AN INSPECTION SYSTEM von NIKIPELOV, Andrey, Van Kampen, Maarten, Farokhipoor, Saeedeh

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Data underlying the publication Promotion of plasma-induced deuterium uptake of ruthenium films by monolayer-thick tin layers von Wang, Shih-Chi, van Kampen, Maarten, Morgan, Thomas

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Data underlying the publication Promotion of plasma-induced deuterium uptake of ruthenium films by monolayer-thick tin layers von Wang, Shih-Chi, van Kampen, Maarten, Morgan, Thomas

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EUV-induced Hydrogen Plasma : Pulsed Mode Operation and Confinement in Scanner von van de Kerkhof, Mark, Yakunin, Andrei M, Astakhov, Dmitry, van Kampen, Maarten, van der Horst, Ruud, Banine, Vadim

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