Effect of 20 MeV proton irradiation on the electrical properties of NiOx/β-Ga2O3 p–n diodes von Feng, Yahui, Guo, Hongxia, Ma, Wuying, Ouyang, Xiaoping, Zhang, Jinxin, Bai, Ruxue, Zhang, Fengqi, Wang, Zhongming, Ma, Xiaohua, Hao, Yue

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The Total Ionizing Dose Effects on Perovskite CsPbBr3 Semiconductor Detector von Ma, Wuying, Liu, Linyue, Qin, Haoming, Gao, Runlong, He, Baoping, Gou, Shilong, He, Yihui, Ouyang, Xiaoping

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Bit upset and performance degradation of NAND flash memory induced by total ionizing dose effects von Jiangkun Sheng, Peng Xu, Mengtong Qiu, Yinhong Luo, Lili Ding, Zhibin Yao, Baoping He, Shilong Gou, Wuying Ma

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Proton Radiation Effects on Dark Signal Distribution of PPD CMOS Image Sensors: Both TID and DDD Effects von Xue, Yuanyuan, Wang, Zujun, Chen, Wei, Liu, Minbo, He, Baoping, Yao, Zhibin, Sheng, Jiangkun, Ma, Wuying, Dong, Guantao, Jin, Junshan

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Isoelectronic aluminum-doped gallium nitride alpha-voltaic cell with efficiency exceeding 4.5 von Gao, Runlong, Liu, Linyue, Xia, Xiaochuan, Wan, Pengying, Ouyang, Xiao, Ma, Wuying, Geng, Xinlei, Wang, Hongyun, Xu, Ruiliang, Zhang, Kexiong, Liang, Hongwei, Ouyang, Xiaoping

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Simulation Study on the Defect Generation, Accumulation Mechanism and Mechanical Response of GaAs Nanowires under Heavy-Ion Irradiation von Jia, Tongxuan, Wang, Zujun, Tang, Minghua, Xue, Yuanyuan, Huang, Gang, Nie, Xu, Lai, Shankun, Ma, Wuying, He, Baoping, Gou, Shilong

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Characterization of total ionizing dose damage in COTS pinned photodiode CMOS image sensors von Wang, Zujun, Ma, Wuying, Huang, Shaoyan, Yao, Zhibin, Liu, Minbo, He, Baoping, Liu, Jing, Sheng, Jiangkun, Xue, Yuan

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Theoretical and experimental study of the dark signal in CMOS image sensors affected by neutron radiation from a nuclear reactor von Xue, Yuanyuan, Wang, Zujun, He, Baoping, Yao, Zhibin, Liu, Minbo, Ma, Wuying, Sheng, Jiangkun, Dong, Guantao, Jin, Junshan

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Research on proton radiation effects on CMOS image sensors with experimental and particle transport simulation methods von Xue, Yuanyuan, Wang, Zujun, Liu, Minbo, He, Baoping, Yao, Zhibin, Sheng, Jiangkun, Ma, Wuying, Dong, Guantao, Jin, Junshan

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Radiation hardness characteristics of self-powered detector based on SiC/Si heterojunction diode von Ma, Wuying, Liu, Linyue, Gao, Runlong, Jia, Rui, Ouyang, Xiaoping

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Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage von Sheng, Jiangkun, Huang, Shaoyan, Yao, Zhibin, Ma, Wuying, He, Baoping, Wang, Zujun, Liu, Minbo

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Influence of Transport Mechanism and Defect Behavior on Leakage Current in 4H-SiC JBS Diodes After Neutron Irradiation von Bai, Ruxue, Guo, Hongxia, Liu, Yitian, Li, Yangfan, Zhang, Fengqi, Ma, Wuying, Zhang, Hong, Ouyang, Xiaoping, Zhong, Xiangli

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High performance radioluminescent nuclear battery based on ultrabright Cs3Cu2I5:Tl single crystal scintillator von Gao, Runlong, Ouyang, Xiao, Wang, Qian, Wan, Pengying, Ma, Wuying, Du, Xue, Wu, Yuntao, Liu, Linyue, Ouyang, Xiaoping

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The Total Ionizing Dose Effects on Perovskite CsPbBr[sub.3] Semiconductor Detector von Ma, Wuying, Liu, Linyue, Qin, Haoming, Gao, Runlong, He, Baoping, Gou, Shilong, He, Yihui, Ouyang, Xiaoping

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High performance radioluminescent nuclear battery based on ultrabright Cs 3 Cu 2 I 5 :Tl single crystal scintillator von Gao, Runlong, Ouyang, Xiao, Wang, Qian, Wan, Pengying, Ma, Wuying, Du, Xue, Wu, Yuntao, Liu, Linyue, Ouyang, Xiaoping

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Degradation analysis of the pinned photodiode CMOS image sensors induced by energetic proton radiation von Wang, Zujun, Xue, Yuanyuan, Wang, Zhongming, Chen, Wei, Yin, Liyuan, Wang, Xinghong, Nie, Xu, Lai, Shankun, Huang, Gang, Wang, Maocheng, Ding, Lili, He, Baoping, Ma, Wuying, Gou, Shilong

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Impact of thermal baking before radiation on the total dose response of bipolar device von Ma, Wuying, Ouyang, Xiaoping, Guo, Hongxia, Li, Pei, He, Baoping, Wang, Zujun, Gou, Shilong, Xue, Yuanyuan

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The influence of temperature and energy on defect evolution and clustering during cascade in GaAs von Jia, Tongxuan, Wang, Zujun, Xue, Yuanyuan, Jiao, Qianli, Yang, Xie, Nie, Xu, Lai, Shankun, Ma, Wuying, He, Baoping, Liu, Minbo

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Fixed Pattern Noise and Temporal Noise Degradation Induced by Radiation Effects in Pinned Photodiode CMOS Image Sensors von Wang, Zujun, Xue, Yuanyuan, Chen, Wei, He, Baoping, Yao, Zhibin, Ma, Wuying, Sheng, Jiangkun

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Degradation of non-linear optocouplers induced by 60 MeV proton irradiation von Xu, Rui, Wang, Zujun, Ning, Hao, Xue, Yuanyuan, Liu, Minbo, Ma, Wuying, Yao, Zhibin, Dong, Guantao

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