Structural characterization of Ga-doped Mg0 .1Zn0.9O layers grown on ZnO/α- Al2O3 templates by P-MBE von Z.Vashaei, C.Harada, A.Setiawan, M.W.Cho, T.Yao

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A surface sensitive optical method for the evaluation of processed ZnO:exploitation of LO phonon interaction von C.Harada, H.Makino, H.Goto, T.Minegishi, T.Suzuki, M.W.Cho, T.Yao

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Characterization of N-doped ZnO layers grown on (0001) GaN/Al2O3 substrates by molecular beam epitaxy von Oh, D.C., Setiawan, A., Kim, J.J., Ko, H.J., Makino, H., Hanada, T., Cho, M.W., Yao, T.

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Electronic structure of Ga1-x CrxN investigated by photoemission spectroscopy von J.J.Kim, H.Makino, K.Yamazaki, A.Ino, H.Namatame, M.Taniguchi, T.Hanada, M.W.Cho, T.Yao

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Photoluminescence linewidth broadening due to alloy/thickness fluctuation of CdxZn1-xSe/ZnSe triple quantum wells von J.H.Chang, S.H.Park, M.Yang, H.S.Ahn, S.N.Yi, K.Goto, M.W.Cho, T.Yao, J.S.Song

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Optical characterization of CdTe/ZnSe fractional monolayer structures grown by atomic layer epitaxy von J.H.Chang, J.Y.Lee, M.Yang, H.S.Ahn, S.N.Yi, K.Goto, K.Godo, H.Makino, M.W.Cho, T.Yao, J.S.Song

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