Correction: "Here, your only relative is money?" why slum social networks do not facilitate neighborhood community development: insights through a sanitation lens von Kwiringira, Japheth Nkiriyehe, Rujumba, Joseph, Ariho, Paulino, Mugisha, James, Zakumumpa, Henry, Mohling, Elizabeth W Perry, Akugizibwe, Mathias, Tumwebaze, Innocent Kamara, Onyutha, Charles

Volltext

Adverse childhood experiences, mental distress, self-harm and suicidality, and cumulative HIV risk by sex in Lesotho von Perry Mohling, Elizabeth W., Recinos, Manderley, Kwiringira, Japheth Nkiriyehe, Phung, Erick, Olwit, Connie, Swahn, Monica H., Massetti, Greta, Self-Brown, Shannon

Volltext

"Here, your only relative is money…" why slum social networks do not facilitate neighborhood community development: insights through a sanitation lens von Kwiringira, Japheth Nkiriyehe, Rujumba, Joseph, Ariho, Paulino, Mugisha, James, Zakumumpa, Henry, Mohling, Elizabeth W Perry, Akugizibwe, Mathias, Tumwebaze, Innocent Kamara, Onyutha, Charles

Volltext

Urban agriculture as an evolved sustainable urban livelihood: evidence from Kampala city, Uganda von Kwiringira, Japheth, Mohling, Elizabeth W. Perry, Mathias, Akugizibwe, Ariho, Paulino, Mugisha, James, Zakumumpa, Henry, Rujumba, Joseph, Tumwebaze, Innocent Kamara

Volltext

Nature of dislocations promoting growth in liquid phase epitaxy of gallium arsenide von Möhling, W., Weishart, H., Bauser, E.

Volltext

Zn-doped InGaAsP (1.3 μm) contact layer for an inverted DH laser structure von Hansen, K., Peiner, E., Schlachetzki, A., Möhling, W., Menniger, H.

Volltext

Morphological stability and crystal structure of CVD-grown zinc selenide von HARTMANN, H, HILDISCH, L, KRAUSE, E, MOHLING, W

Volltext

Epitaxial Layers of Gallium Phosphide on Silicon von Noack, J., Möhling, W.

Volltext

W-Re(6 wt.%) and W-Ti(10 wt.%) alloys as diffusion barriers between aluminium and silicon von Lange, H., Möhling, W., Marxsen, G.

Volltext

Characterization of dislocations by double crystal X-ray topography in back reflection von Kaganer, V. M., Möhling, W.

Volltext

Preparation and Structural Properties of GaP-Layers Grown on Ge-Substrates von Kies, J., Möhling, W., Noack, J.

Volltext

Double Crystal Topography Compensating for the Strain in Processed Samples von Jenichen, B., Köhler, B., Möhling, W.

Volltext

Versatility and Limitations of Double Crystal Reflection Topography for Dislocation Imaging von Möhling, W.

Volltext

Dislocations and their origin in cadmium sulfide crystals grown from the vapour phase von Möhling, W.

Volltext

Sensitivity of plane wave topography to microdefects von Köhler, R., Möhling, W.

Volltext

Notizen: Zickzack-Kontrast an Versetzungen im Röntgen-Beugungsmikrogramm von Möhling, W.

Volltext

Microdefects in silicon different from swirls von Köhler, R., Möhling, W., Pasemann, M.

Volltext

Spiralversetzungen in dampfphasengezüchteten CdS‐Kristallen von Möhling, W., Peibst, H.

Volltext

Piezowiderstandsmessungen an n‐Silizium von Asche, M., Möhling, W.

Volltext

RTK 2-a double-crystal x-ray topographic camera applying new principles von Jenichen, B, Kohler, R, Mohling, W

Volltext