Study of heterostructures according to single-crystal X-ray diffractometry von Lyutsau, A. V., Krymko, M. M., Enisherlova, K. L., Temper, E. M., Razgulyaev, I. I.

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New possible applications of Kumakhov polycapillary optics in X-ray diffraction microscopy (X-ray topography) von Lyutsau, A. V., Lyutsau, V. G., Kumakhov, M. A., Ibraimov, N. S., Nikitina, S. V., Likoushina, E. V., Zvonkov, A. D., Kotyolkin, A. V.

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Establishing wafer surface defects using polycapillary optics von Likhoushina, E. V., Kumakhov, M. A., Ibraimov, N. S., Nikitina, S. V., Bolotokov, A. A., Zvonkov, A. D., Lyutsau, A. V., Yudina, M. V.

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XRD complex for controlling orientation and lattice elastic deformation in 12-inch wafers von Zvonkov, A. D., Kumakhov, M. A., Ibraimov, N. S., Lyutsau, A. V., Nikitina, S. V., Kotyolkin, A. V., Bulkin, A. E., Ivanovsky, Yu. S., Likhoushina, E. V., Bolotokov, A. A., Yudina, M. V.

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Structure, properties, and tests of carbonreinforced plastics von Tumanov, A. T., Gunyaev, G. M., Lyutsau, V. G., Stepanychev, E. I.

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