Improved determination of matrix compostion of Hg1−xCdxTe by SIMS von Sheng, Jack, Wang, Larry, Lux, Gayle E., Gao, Yumin

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SIMS characterization of HgCdTe and related II-VI compounds von Sheng, Jack, Wang, Larry, Lux, Gayle E

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Modeling of boron diffusion in polysilicon-on-silicon structures using a rapid thermal anneal step for ultra-shallow junction formation von Sultan, Akif, Batra, Shubneesh, Lux, Gayle E., Banerjee, Sanjay

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Paradoxical boron profile broadening caused by implantation through a screen oxide layer von Park, C., Klein, K.M., Tasch, A.F., Simonton, R.B., Lux, G.E.

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