Treffer 1 - 3 von 3 für Suche 'Lux, G.E.', Suchdauer: 0,73s Treffer weiter einschränken
  1. 1
    Depth profiles, projected ranges, and secondary ion mass spectrometry relative sensitivity factors for more than 50 elements from hydrogen to uranium implanted into metals

    Depth profiles, projected ranges, and secondary ion mass spectrometry relative sensitivity factors for more than 50 elements from hydrogen to uranium implanted into metals von Wilson, R.G., Stevie, F.A., Lux, G.E., Kirschbaum, C.L., Frank, S., Pallix, J.

    Veröffentlicht in Surface & coatings technology

    Volltext
    Artikel

    Zu den Favoriten
    Gespeichert in:
  2. 2
    Paradoxical boron profile broadening caused by implantation through a screen oxide layer

    Paradoxical boron profile broadening caused by implantation through a screen oxide layer von Park, C., Klein, K.M., Tasch, A.F., Simonton, R.B., Lux, G.E.


    Volltext
    Tagungsbericht

    Zu den Favoriten
    Gespeichert in:
  3. 3
    EFFECTS OF IRRADIATION ON THE COURTSHIP BEHAVIOR OF MEDFLY (DIPTERA, TEPHRITIDAE) MASS REARED FOR THE STERILE INSECT TECHNIQUE

    EFFECTS OF IRRADIATION ON THE COURTSHIP BEHAVIOR OF MEDFLY (DIPTERA, TEPHRITIDAE) MASS REARED FOR THE STERILE INSECT TECHNIQUE von Lux, S. A, Vilardi, J. C, Liedo, P, Gaggl, K, Calcagno, G. E, Munyiri, F. N, Vera, M. T, Manso, F

    Veröffentlicht in The Florida entomologist

    Volltext
    Artikel

    Zu den Favoriten
    Gespeichert in:

Suchwerkzeuge: