Total pattern fitting for the combined size–strain–stress–texture determination in thin film diffraction von Lutterotti, Luca

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Crystallography Open Database (COD): an open-access collection of crystal structures and platform for world-wide collaboration von Gra ulis, Saulius, Daškevi, Adriana, Merkys, Andrius, Chateigner, Daniel, Lutterotti, Luca, Quirós, Miguel, Serebryanaya, Nadezhda R., Moeck, Peter, Downs, Robert T., Le Bail, Armel

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Full‐profile search–match by the Rietveld method von Lutterotti, Luca, Pillière, Henry, Fontugne, Christophe, Boullay, Philippe, Chateigner, Daniel

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Crystallography Open Database - an open-access collection of crystal structures von Gražulis, Saulius, Chateigner, Daniel, Downs, Robert T., Yokochi, A. F. T., Quirós, Miguel, Lutterotti, Luca, Manakova, Elena, Butkus, Justas, Moeck, Peter, Le Bail, Armel

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Rietveld texture analysis from synchrotron diffraction images. I. Calibration and basic analysis von Lutterotti, Luca, Vasin, Roman, Wenk, Hans-Rudolf

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Rietveld texture analysis from synchrotron diffraction images. II. Complex multiphase materials and diamond anvil cell experiments von Wenk, Hans-Rudolf, Lutterotti, Luca, Kaercher, Pamela, Kanitpanyacharoen, Waruntorn, Miyagi, Lowell, Vasin, Roman

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ReX: a computer program for structural analysis using powder diffraction data von Bortolotti, Mauro, Lutterotti, Luca, Lonardelli, Ivan

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Quantitative Texture Analysis of Spark Plasma Textured n-Bi2Te3 von Lognoné, Quentin, Gascoin, Franck, Lebedev, Oleg I., Lutterotti, Luca, Gascoin, Stéphanie, Chateigner, Daniel

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Particle anisotropy and crystalline phase transition in one-pot synthesis of nano-zirconia: a causal relationship von Tana, Francesca, Serafini, Andrea, Lutterotti, Luca, Cigada, Alberto, Variola, Fabio, Bondioli, Federica, De Nardo, Luigi

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Modeling Solidification Microstructures of Steel Round Billets Obtained by Continuous Casting von Straffelini, Giovanni, Lutterotti, Luca, Tonolli, Matteo, Lestani, Massimo

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32-Channel silicon strip detection module for combined X-ray fluorescence spectroscopy and X-ray diffractometry analysis von Carminati, Marco, Borghi, Giacomo, Demenev, Evgeny, Gugiatti, Matteo, Pepponi, Giancarlo, Crivellari, Michele, Ficorella, Francesco, Ronchin, Sabina, Zorzi, Nicola, Borovin, Evgeny, Lutterotti, Luca, Fiorini, Carlo

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Advances in exploiting preferred orientation in the structure analysis of polycrystalline materials von Grässlin, Jürgen, McCusker, Lynne B., Baerlocher, Christian, Gozzo, Fabia, Schmitt, Bernd, Lutterotti, Luca

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Method for the simultaneous determination of anisotropic residual stresses and texture by x-ray diffraction von Ferrari, Mauro, Lutterotti, Luca

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Electron diffraction characterization of nanocrystalline materials using a Rietveld‐based approach. Part I. Methodology von Sinha, Ankur, Bortolotti, Mauro, Ischia, Gloria, Lutterotti, Luca, Gialanella, Stefano

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Rietveld Refinement of Electron Diffraction Patterns of Nanocrystalline Materials Using MAUD: Two-Beam Dynamical Correction Implementation and Applications von Sinha, Ankur, Abram, Valentino, Lutterotti, Luca, Gialanella, Stefano

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Electron diffraction characterization of nanocrystalline materials using a Rietveld‐based approach. Part II. Application to microstructural analysis von Sinha, Ankur, Ischia, Gloria, Lutterotti, Luca, Gialanella, Stefano

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Ambipolar organic thin film transistors based on a soluble pentacene derivative von Işık, Dilek, Shu, Ying, Tarabella, Giuseppe, Coppedè, Nicola, Iannotta, Salvatore, Lutterotti, Luca, Cicoira, Fabio, Anthony, John Edward, Santato, Clara

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Simultaneous combined XRF-XRD analysis of geological sample: New methodological approach for on-site analysis on New-Caledonian Ni-rich harzburgite von Maestracci, Barbara, Delchini, Sylvain, Chateigner, Daniel, Pilliere, Henry, Lutterotti, Luca, Borovin, Evgeny

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MILK: a Python scripting interface to MAUD for automation of Rietveld analysis von Savage, Daniel J., Lutterotti, Luca, Biwer, Christopher M., McKerns, Michael, Bolme, Cynthia, Knezevic, Marko, Vogel, Sven C.

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From Closed Packed Metal Structures to Monoclinic SMA and Multiphase Complex Materials: 20 Years of Rietveld Stress-Texture Analyses von Lutterotti, Luca

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