Investigation of channel hot electron injection by localized charge-trapping nonvolatile memory devices von Lusky, E., Shacham-Diamand, Y., Mitenberg, G., Shappir, A., Bloom, I., Eitan, B.

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Electrons retention model for localized charge in oxide-nitride-oxide (ONO) dielectric von Lusky, E., Shacham-Diamand, Y., Bloom, I., Eitan, B.

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Impact of programming charge distribution on threshold voltage and subthreshold slope of NROM memory cells von Larcher, L., Verzellesi, G., Pavan, P., Lusky, E., Bloom, I., Eitan, B.

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Characterization of channel hot electron injection by the subthreshold slope of NROM/sup TM/ device von Lusky, E., Shacham-Diamand, Y., Bloom, I., Eitan, B.

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Characterization of channel hot electron injection by the subthreshold slope of NROM[trademark] device von Lusky, E, Shacham-Diamand, Y, Bloom, I, Eitan, B

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Traps spectroscopy of the Si3Ni4 layer using localized charge-trapping nonvolatile memory device von Lusky, Eli, Shacham-Diamand, Yosi, Shappir, Assaf, Bloom, Ilan, Eitan, Boaz

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Spatial characterization of localized charge trapping and charge redistribution in the NROM device von Shappir, Assaf, Levy, David, Shacham-Diamand, Yosi, Lusky, Eli, Bloom, Ilan, Eitan, Boaz

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Lateral charge transport in the nitride layer of the NROM non-volatile memory device von Shappir, Assaf, Shacham-Diamand, Yosi, Lusky, Eli, Bloom, Ilan, Eitan, Boaz

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Characterization of channel hot electron injection by the subthreshold slope of NROMTM device von Lusky, E, Shacham-Diamand, Y, Bloom, I, Eitan, B

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Characterization of channel hot electron injection by thesubthreshold slope of NROM(TM) device von Lusky, E, Shacham-Diamand, Y, Bloom, I, Eitan, B

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Characterization of channel hot electron injection by the subthreshold slope of NROM super(TM) device von Lusky, E, Shacham-Diamand, Y, Bloom, I, Eitan, B

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Spatial characterization of hot carriers injected into the gate dielectric stack of a MOSFET based non-volatile memory device von Shappir, A., Levy, D., Geva, G., Shacham-Diamand, Y., Lusky, E., Bloom, I., Eitan, B.

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Data retention reliability model of NROM nonvolatile memory products von Janai, M., Eitan, B., Shappir, A., Lusky, E., Bloom, I., Cohen, G.

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The two-bit NROM reliability von Shappir, A., Lusky, E., Cohen, G., Bloom, I., Janai, M., Eitan, B.

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Charge Loss Mechanisms in a Localized Trapping Based Nonvolatile Memory Device von Yael Shur, Shacham-Diamand, Y., Lusky, E., Eitair, B., Shappir, A.

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An High Density Data Flash Based on Trapped Charge Programming and Erasing von Sun, P., Chen, B., Chen, F., Chen, G., Chen, W., Cho, M., Kwon, S., Liu, E., Della Pia, M., Qu, L., Si, W., Sun, J., Tan, C., Tsai, A., Wang, A., Xu, D., Yang, V., Yen, C., Miu, K., Yi, C., Lusky, E., Polanski, Y., Nistan, I., Betser, Y., Eitan, B.

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A New Twin Flash™ Cell for 2 and 4 Bit Operation at 63nm Feature Size von Nagel, N., Boubekeur, H., Heinrichsdorff, F., Bach, L., Polei, V., Gupta, J., Pritchard, D., Riedel, S., Strassburg, M., Deppe, J., Bewersdorff-Sarlette, U., Muller, T., Verhoeven, M., Lattard, L., Markert, M., Ruttkowski, E., Mikalo, R., Willer, J., Schulze, N., Ludwig, C., v. Kamienski, E.G. Stein, Mikolajick, T., Isler, M., Kusters, K.-H., Shappir, A., Shur, Y., Lusky, E., Eitan, B., Pissors, V., Sachse, J.-U., Manger, D., Caspary, D., Parascandola, S., Olligs, D.

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Cardiovascular and metabolic effects of metformin in patients with type 1 diabetes (REMOVAL): a double-blind, randomised, placebo-controlled trial von Petrie, John R, Prof, Chaturvedi, Nishi, Prof, Ford, Ian, Prof, Brouwers, Martijn C G J, MD, Greenlaw, Nicola, MSc, Tillin, Therese, MBBS, Hramiak, Irene, Prof, Hughes, Alun D, Prof, Jenkins, Alicia J, Prof, Klein, Barbara E K, Prof, Klein, Ronald, Prof, Ooi, Teik C, Dr, Rossing, Peter, Prof, Stehouwer, Coen D A, Prof, Sattar, Naveed, Prof, Colhoun, Helen M, Prof

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‘A kindergarten teacher must have 100 eyes and 100 ears!’: Kindergarten teachers' experiences coping with child sexual abuse and problematic sexual behavior von Sigad, Laura I., Gosen, Noah Bar, Golan, Limor, Lusky-Weisrose, Efrat, Shaibe, Jordan, Tener, Dafna, Moshon-Cohen, Tamara E., Roe, Daniel

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“The Good World You Thought Existed does not”: Teachers’ Classroom and Self-Transformation Following Sexual Abuse of Pupils von Sigad, Laura I., Lusky-Weisrose, Efrat, Malki, Avivit, Roe, Daniel, Moshon-Cohen, Tamara E., Tener, Dafna

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