Affective Formation of Publics: Places, Networks, and Media von Lünenborg, Margreth, Röttger-Rössler, Birgitt

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CMOS gate oxide defects induced by pre-gate plasma process von Carrère, J-P., Garnier, P., Desvoivres, L., Berthoud, A., Lunenborg, M.

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Dealing with hot-carrier aging in nMOS and DMOS, models, simulations and characterizations von Mouthaan, A.J, Salm, C, Lunenborg, M.M, de Wolf, M.A.R.C, Kuper, F.G

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Comprehensive physical modeling of nmosfet hot-carrier-induced degradation von Lunenborg, M.M., De Graaff, H.C., Mouthaan, A.J., Verweij Mesa, J.F.

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Validated 90nm CMOS technology platform with low-k copper interconnects for advanced system-on-chip (SoC) von Devoivre, T., Lunenborg, M., Julien, C., Carrere, J.-P., Ferreira, P., Toren, W.J., VandeGoor, A., Gayet, P., Berger, T., Hinsinger, O., Vannier, P., Trouiller, Y., Rody, Y., Goirand, P.-J., Palla, R., Thomas, I., Guyader, F., Roy, D., Borot, B., Planes, N., Naudet, S., Pico, F., Duca, D., Lalanne, F., Heslinga, D., Haond, M.

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Tup1p is important for peroxisome degradation von LEAOHELDER, A, KRIKKEN, A, LUNENBORG, M, KIEL, J, VEENHUIS, M, VANDERKLEI, I

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On the design of a reliability circuit simulator von Verweij, Jan, Lunenborg, Meindert

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Sacrificial spacer technology for suppressed reverse narrow channel effects with shallow trench isolation von Lunenborg, M., De Coster, W., Guelen, J., Inard, A.

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MOS model 9 Parameter Extraction with Realistic Time-Dependence for Hot-Carrier Reliability Simulation von Lunenborg, M.M., Boter, J.D., Velghe, R.M.D.A.

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Investigations of stress sensitivity of 0.12 CMOS technology using process modeling von Senez, V., Hoffmann, T., Robilliart, E., Bouche, G., Jaouen, H., Lunenborg, M., Carnevale, G.

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Characterization of the diode leakage current in advanced 0.12 /spl mu/m CMOS technology. (Does stress play a role?) von Toren, W.-J., Perrin, E., Lunenborg, M.

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Anomalous NMOSFET Substrate Current Behavior at Accelerated Hot-Carrier Stress Conditions von Lunenborg, M.M., de Graaff, H.C., Mouthaan, A.J., Verweij, J.F.

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Semiconductor substrate temperature determination von KORDIC SRDJAN, LUNENBORG MEINDERT M, JACQUEMIN JEAN-PHILIPPE

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Semiconductor substrate temperature determination von Kordic, Srdjan, Lunenborg, Meindert M, Jacquemin, Jean-Philippe

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VERFAHREN UND VORRICHTUNG ZUR BESTIMMUNG DER TEMPERATUR EINES HALBLEITERSUBSTRATS von LUNENBORG, MEINDERT M, JACQUEMIN, JEAN-PHILIPPE, KORDIC, SRDJAN

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METHOD AND DEVICE FOR DETERMINING THE TEMPERATURE OF A SEMICONDUCTOR SUBSTRATE von LUNENBORG, MEINDERT M, JACQUEMIN, JEAN-PHILIPPE, KORDIC, SRDJAN

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SEMICONDUCTOR SUBSTRATE TEMPERATURE DETERMINATION von KORDIC SRDJAN, LUNENBORG MEINDERT M, JACQUEMIN JEAN-PHILIPPE

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METHOD AND DEVICE FOR DETERMINING THE TEMPERATURE OF A SEMICONDUCTOR SUBSTRATE von LUNENBORG, MEINDERT M, JACQUEMIN, JEAN-PHILIPPE, KORDIC, SRDJAN

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SEMICONDUCTOR SUBSTRATE TEMPERATURE DETERMINATION von JACQUEMIN, JEAN-PHILIPPE, LUNENBORG, MEINDERT, M, KORDIC, SRDJAN

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METHOD AND DEVICE FOR DETERMINING THE TEMPERATURE OF A SEMICONDUCTOR SUBSTRATE von JACQUEMIN, JEAN-PHILIPPE, LUNENBORG, MEINDERT, M, KORDIC, SRDJAN

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