Temperature Dependence of the Dielectric Function of Orthorhombic GeS von LUKES, F

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Ellipsometric studies of natural films on GaAs von LUKES, F

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Ellipsometry of Silicon with Natural Surface Film at 632.8 nm von LUKES, F

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Temperature Dependence of Ellipsometric Angles of Silicon von LUKES, F

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Natural surface films on GeS von LUKES, F

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Oxidation of Si and GaAs in air at room temperature von Lukeš, F.

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Electroreflectance spectrum of inas in the range of E0 and E0 + δ0 transitions von Lukeš, F.

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Photoreflectance Study of a Fibonacci Superlattice von Pánek, P., Munzar, D., Humlíček, J., Lukeš, F., Ploog, K.

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Characterization of TiO2 and ZrO2 coatings on silica slabs and fibres von JUREK, K, GUGLIELMI, M, KUNCOVA, G, RENNER, O, LUKES, F, NAVRATIL, M, KROUSKY, E, VORLICEK, V, KOKESOVA, K

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A Note on the Study of the Refractive Index of As2S3 Films Evaporated onto Glass Substrates von Lukeš, F., Navrátil, K., Cimpl, Z., Kosek, F.

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On the interpretation of ellipsometric studies on GaP (110) single crystals von Lukeš, F.

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Ellipsometric and reflectance studies of GaAs/AlAs superlattices von Humliček, J., Lukeš, F., Navrátil, K., Garriga, M., Ploog, K.

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Optical transitions in strained Ge/Si superlattices von Schmid, U., Humlíček, J., Lukeš, F., Cardona, M., Presting, H., Kibbel, H., Kasper, E., Eberl, K., Wegscheider, W., Abstreiter, G.

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Optical analysis of thin gold films by combined reflection and transmission ellipsometry von Ohlidal, I, Lukes, F

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Describing Patterns of Care in Pancreatic Cancer: A Population-Based Study von Burmeister, Elizabeth A, OʼConnell, Dianne L, Beesley, Vanessa L, Goldstein, David, Gooden, Helen M, Janda, Monika, Jordan, Susan J, Merrett, Neil D, Payne, Madeleine E, Wyld, David, Neale, Rachel E

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Dielectric function of [formula omitted]superlattices grown on GaAs substrates with different orientation von Lukeš, F., Ploog, K.

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Electroreflectance and thermoreflectance spectra of SnS von Lukeš, F., Humlíček, J., Schmidt, E.

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Absorption Edge of SnSe von Lukeš, F., Schmidt, E., Humlíček, J., Dub, P., Kosek, F.

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Rough silicon surfaces studied by optical methods von Ohlidal, I., Lukeš, F., Navràtil, K.

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Optical Properties of GeS von Lukeš, F., Schmidt, E., Humlíček, J., Dub, P.

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