Highly Uniform Epitaxial ZnO Nanorod Arrays for Nanopiezotronics von Volk, J., Nagata, T., Erdélyi, R., Bársony, I., Tóth, A. L., Lukács, I. E., Czigány, Zs, Tomimoto, H., Shingaya, Y., Chikyow, T.

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Design of UV-crosslinked polymeric thin layers for encapsulation of piezoelectric ZnO nanowires for pressure-based fingerprint sensors von Bouvet-Marchand, A., Graillot, A., Volk, J., Dauksevicius, R., Sturm, C., Grundmann, M., Saoutieff, E., Viana, A., Christian, B., Lebedev, V., Radó, J., Lukács, I. E., N., Q. Khánh, Grosso, D., Loubat, C.

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Highly Uniform Epitaxial ZnO Nanorod Arrays for Nanopiezotronics von Volk, J, Nagata, T, Erdélyi, R, Bársony, I, Tóth, A. L, Lukács, I. E, Czigány, Zs, Tomimoto, H, Shingaya, Y, Chikyow, T

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Structural, mechanical and biological comparison of TiC and TiCN nanocomposites films von Balazsi, K, Lukacs, I E, Gurban, S, Menyhard, M, Bacakova, L, Vandrovcova, M, Balazsi, C

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Different sensing mechanisms in single wire and mat carbon nanotubes chemical sensors von Neumann, P. L., Obreczán, V. I., Dobrik, G., Kertész, K., Horváth, E., Lukács, I. E., Biró, L. P., Horváth, Z. E.

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Sub-pixel detection of a grid's node positions for optical diagnostics von Lukács, I.E., Riesz, Ferenc

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Mechanical characterization of epitaxially grown zinc oxide nanorods von Erdélyi, R., Halász, V., Szabó, Z., Lukács, I.E., Volk, J.

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Makyoh-topography study of the swirl defect in Si wafers von Riesz, Ferenc, Pap, A.E., Ádám, M., Lukács, I.E.

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Sensitivity and measurement errors of Makyoh topography von Riesz, F., Lukács, I. E.

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Piezo-force and Vibration Analysis of ZnO Nanowire Arrays for Sensor Application von Christian, B., Volk, J., Lukàcs, I.E., Sautieff, E., Sturm, C., Graillot, A., Dauksevicius, R., O’Reilly, E., Ambacher, O., Lebedev, V.

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Error analysis of Makyoh-topography surface height profile measurements von Lukács, I. E., Riesz, F.

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A Simple Algorithm for the Reconstruction of Surface Topography from Makyoh-Topography Images von Lukács, I. E., Riesz, F.

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Design of UV-crosslinked polymeric thin layers for encapsulation of piezoelectric ZnO nanowires for pressure-based fingerprint sensorsElectronic supplementary information (ESI) ava... von Bouvet-Marchand, A, Graillot, A, Volk, J, Dauksevicius, R, Sturm, C, Grundmann, M, Saoutieff, E, Viana, A, Christian, B, Lebedev, V, Radó, J, Lukács, I. E, Grosso, D, Loubat, C

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Different sensing mechanisms in single wire and mat carbon nanotubes chemical sensors von Neumann, P L, Obreczán, V I, Dobrik, G, Kertész, K, Horváth, E, Lukács, I E, Biró, L P, Horváth, Z E

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Makyoh-topography assessment of etch and polish removal of processed circuits for substrate re-use von Lukács, István E, Riesz, Ferenc

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Determination of Deformation Induced by Thin Film Residual Stress in Structures of Millimeter Size von Lukács, I.E., Vízváry, Z., Fürjes, P., Riesz, F., Dücsö, C., Bársony, I.

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Imaging-limiting effects of apertures in Makyoh-topography instruments von Lukács, István E, Riesz, Ferenc

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High spatial resolution Makyoh topography using shifted grid illumination von Lukács, István E., Riesz, Ferenc, Laczik, Zsolt J.

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High spatial resolution Makyoh topography using shifted grid illumination von Lukacs, I E, Riesz, F, Laczik, Z J

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Analytical Methods in Probability Theory: Proceedings of the Conference Held at Oberwolfach, Germany, June 9-14, 1980 von Dugue, Daniel, Lukacs, E, Rohatgi, V. K

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