Treffer 1 - 5 von 5 für Suche 'Lugo Muñoz, Denise C.', Suchdauer: 0,69s Treffer weiter einschränken
  1. 1
    A new integration-based procedure to separately extract series resistance and mobility degradation in MOSFETs

    A new integration-based procedure to separately extract series resistance and mobility degradation in MOSFETs von Muci, Juan, Muñoz, Denise C Lugo, Rey, Álvaro D Latorre, Ortiz-Conde, Adelmo, García-Sánchez, Francisco J, Ho, Ching-Sung, Liou, Juin J


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  2. 2
    Indirect fitting procedure to separate the effects of mobility degradation and source-and-drain resistance in MOSFET parameter extraction

    Indirect fitting procedure to separate the effects of mobility degradation and source-and-drain resistance in MOSFET parameter extraction von Ortiz-Conde, Adelmo, García-Sánchez, Francisco J., Muci, Juan, Lugo Muñoz, Denise C., Latorre Rey, Álvaro D., Ho, Ching-Sung, Liou, Juin J.


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  3. 3
    Modelling solar cell S-shaped I-V characteristics with DC lumped-parameter equivalent circuits a review

    Modelling solar cell S-shaped I-V characteristics with DC lumped-parameter equivalent circuits a review von García-Sánchez, Francisco, Romero, Beatriz, Lugo-Muñoz, Denise, del, Pozo, Arredondo, Belén, Liou, Juin, Ortiz-Conde, Adelmo


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  4. 4
    Extraction of MOSFET Model Parameters from the Measured Source-to-drain Resistance

    Extraction of MOSFET Model Parameters from the Measured Source-to-drain Resistance von Garcia-Sanchez, Francisco J., Muci, Juan, Lugo Muñoz, Denise C., Latorre Reya, Alvaro A., Ortiz-Conde, Adelmo, Ho, Ching S., Liou, Juin J.


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  5. 5
    Parameter Extraction in Quadratic Exponential Junction Model with Series Resistance using Global Lateral Fitting

    Parameter Extraction in Quadratic Exponential Junction Model with Series Resistance using Global Lateral Fitting von Lugo-Muñoz, Denise, De Souza, Michelly, Pavanello, Marcelo A., Flandre, Denis, Muci, Juan, Ortiz-Conde, Adelmo, Garcia-Sanchez, Francisco J.


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