Local transport and trapping issues in Al2O3 gate oxide structures von Ludeke, R., Cuberes, M. T., Cartier, E.

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Electrical characterization of gate oxides by scanning probe microscopies von Ludeke, R.

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Imaging of trapped charge in SiO2 and at the SiO2–Si interface von Ludeke, R., Cartier, E.

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Electrostatic Field and Partial Fermi Level Pinning at the Pentacene−SiO2 Interface von Chen, Liwei, Ludeke, R, Cui, Xiaodong, Schrott, Alejandro G, Kagan, Cherie R, Brus, Louis E

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Novel transport effects in high-bias ballistic-electron-emission spectroscopy von LUDEKE, R

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Structural and surface potential characterization of annealed HfO2 and (HfO2)x(SiO2)1-x films von Ludeke, R., Gusev, E.

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Hot electron scattering processes in metal films and at metal-semiconductor interfaces von LUDEKE, R, BAUER, A

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Potential imaging of Si∕HfO2/polycrystalline silicon gate stacks: Evidence for an oxide dipole von Ludeke, R., Narayanan, V., Gusev, E. P., Cartier, E., Chey, S. J.

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Determination of the energy-dependent conduction band mass in SiO2 von Ludeke, R., Cartier, E., Schenk, Andreas

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Ballistic-electron-emission microscopy and spectroscopy of GaP(110)-metal interfaces von PRIETSCH, M, LUDEKE, R

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Imaging of oxide and interface charges in SiO2-Si von LUDEKE, R, CARTIER, E

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Hot electron transport in SiO2 probed with a scanning tunnel microscope von Ludeke, R., Bauer, A., Cartier, E.

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Quantum interference in SiO2: A conduction-band mass reappraisal von Ludeke, R., Wen, H. J., Schenk, Andreas

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Direct determination of impact ionization quantum yield in Si by ballistic-electron-emission microscopy von Bauer, A, Ludeke, R

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Localized electron trapping and trap distributions in SiO2 gate oxides von Ludeke, R., Wen, H. J.

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Electrostatic Field and Partial Fermi Level Pinning at the Pentacene−SiO 2 Interface von Chen, Liwei, Ludeke, R., Cui, Xiaodong, Schrott, Alejandro G., Kagan, Cherie R., Brus, Louis E.

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The effects of microstructure on interface characterization von Ludeke, R.

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The formation of interfaces on GaAs and related semiconductors: A reassessment von Ludeke, R.

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Defects and metal states: Towards a predictive model for the Schottky barrier von Ludeke, R

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BEEM spectroscopy at interfaces of Au, Ag, Cu, Mg and Ni films with n-GaP(110) von Prietsch, M., Ludeke, R.

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