XPS Depth Profiling of Air-Oxidized Nanofilms of NbN on GaN Buffer-Layers von Lubenchenko, A.V., Batrakov, A.A., Krause, S., Pavolotsky, A.B., Shurkaeva, I. V., Ivanov, D.A., Lubenchenko, O.I.

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An XPS method for layer profiling of NbN thin films von Lubenchenko, A.V., Batrakov, A.A., Pavolotsky, A.B., Krause, S., Shurkaeva, I.V., Lubenchenko, O.I., Ivanov, D.A.

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Influence of nano-sized horizontal inhomogeneities on surface profiling by means of XPS von Lukyantsev, D.S., Lubenchenko, A.V., Ivanov, D.A., Lubenchenko, O.I., Fedotov, A.S.

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Modern methods of transfer theory used for solution of signal identification problems of XPS von Afanas'ev, V.P., Kaplya, P.S., Lubenchenko, A.V., Lubenchenko, O.I.

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Air-Oxidation of Nb Nano-Films von Lubenchenko, A. V., Batrakov, A. A., Ivanov, D. A., Lubenchenko, O. I., Lashkov, I. A., Pavolotsky, A. B., Schleicher, B., Albert, N., Nielsch, K.

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