Numerical Simulation of Photoelectric Emission from a Nano-structured Surface von Lukiantsev, D. S., Lubenchenko, A. V., Ivanov, D. A., Budaev, V. P., Pavlov, I. N., Pavlov, O. N., Lubenchenko, O. I.

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Interface Layers of Niobium Nitride Thin Films von Lubenchenko, A V, Iachuk, V A, Krause, S, Pavolotsky, A B, Ivanov, D A, Lubenchenko, O I, Pavlov, O N

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Non-destructive chemical and phase layer profiling of multicomponent multilayer thin ultrathin films von Lubenchenko, A V, Ivanov, D A, Lubenchenko, O I, Yachuk, V A, Pavlov, O N, Lashkov, I A, Lukyantsev, D S

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Air-Oxidation of Nb Nano-Films von Lubenchenko, A. V., Batrakov, A. A., Ivanov, D. A., Lubenchenko, O. I., Lashkov, I. A., Pavolotsky, A. B., Schleicher, B., Albert, N., Nielsch, K.

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Modern methods of transfer theory used for solution of signal identification problems of XPS von Afanas'ev, V.P., Kaplya, P.S., Lubenchenko, A.V., Lubenchenko, O.I.

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Controlled Ultra-Thin Suboxide Films Generation in Metal-Oxide Systems by Ar+ Ion Irradiation von Lubenchenko, A V, Lukyantsev, D S, Pavolotsky, A B, Ivanov, D A, Lubenchenko, O I, Ivanova, I V, Iachuk, V A, Pavlov, O N

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Using the International Standard of Auditing 315 “Identifying and Assessing the Risks of Material Misstatement through Understanding the Entity and Its Environment” in the Auditing... von LUBENCHENKO, O., KORINKO, M.

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The Internal Standard “The Policy and Procedure of the System for Internal Quality Control of Audit Services” von Lubenchenko, O. E.

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