Functional test of field programmable analog arrays von Balen, T.R., Calvano, J.V., Lubaszewski, M.S., Renovelf, M.

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Testing a PWM circuit using functional fault models and compact test vectors for operational amplifiers von Calvano, J.V., Alves, V.C., Lubaszewski, M.S.

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Single Event Upset in SRAM-based Field Programmable Analog Arrays: Effects and Mitigation von Balen, T.R., Kastensmidt, F.L., Lubaszewski, M.S., Renovell, M.

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Designing for test analog signal processors for MEMS-based inertial sensors von Calvano, J.V., Lubaszewski, M.S.

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On-line test of a switching circuit von Bastos, J.A., Kussler, J.A., Cassol, L.J., Lubaszewski, M.S.

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Fault models and compact test vectors for MOS opamp circuits von Calvano, J.V., Alves, V.C., Lubaszewski, M.S., Mesquita, A.C.

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Testing embedded single and multi-port RAMs using BIST and boundary scan von Castro Alves, V., Lubaszewski, M.S., Nicolaidis, M., Courtois, B.

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Designing the dispatch stage of a superscalar microprocessor von Alcantara, J.M.S., Alves, V.C., Filho, E.M.C.

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