Whistler waves observed by Solar Orbiter/RPW between 0.5 AU and 1 AU von Kretzschmar, M., Chust, T., Krasnoselskikh, Graham, D., Colomban, L., Maksimovic, M., Khotyaintsev, Yu, Soucek, J., Steinvall, K., Santolik, O., Jannet, G., Brochot, J-Y, Le Contel, O., Vecchio, A., Bonnin, X., Bale, S. D., Froment, C., Larosa, A., Bergerard-Timofeeva, M., Fergeau, P., Lorfevre, E., Plettemeier, D., Steller, M., Stverak, S., Travnicek, P., Vaivads, A., Horbury, T. S., O'Brien, H., Evans, Angelini, Owen, C. J., Louarn, P.

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Experimental Characterization and Simulation of Electron-Induced SEU in 45-nm CMOS Technology von Samaras, A., Pourrouquet, P., Sukhaseum, N., Gouyet, L., Vandevelde, B., Chatry, N., Ecoffet, R., Bezerra, F., Lorfevre, E.

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Density fluctuations associated with turbulence and waves First observations by Solar Orbiter von Khotyaintsev, Yu, Graham, D. B., Vaivads, A., Steinvall, K., Edberg, N. J. T., Eriksson, A., Johansson, E. P. G., Sorriso-Valvo, L., Maksimovic, M., Bale, S. D., Chust, T., Krasnoselskikh, Kretzschmar, M., Lorfevre, E., Plettemeier, D., Soucek, J., Steller, M., Stverak, S., Travnicek, P., Vecchio, A., Horbury, T. S., O'Brien, H., Evans, Angelini, Lorfevre, E.

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Single Events Induced By Heavy Ions and Laser Pulses in Silicon Schottky Diodes von Mauguet, M., Lagarde, D., Widmer, F., Chatry, N., Marie, X., Lorfevre, E., Bezerra, F., Marec, R., Calvel, P.

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Benchmarking Ionizing Space Environment Models von Bourdarie, S., Inguimbert, C., Standarovski, D., Vaille, J.-R, Sicard-Piet, A., Falguere, D., Ecoffet, R., Poivey, C., Lorfevre, E.

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Solar wind current sheets and deHoffmann-Teller analysis First results from Solar Orbiter's DC electric field measurements von Steinvall, K., Khotyaintsev, Yu, Cozzani, G., Vaivads, A., Yordanova, E., Eriksson, A., Edberg, N. J. T., Maksimovic, M., Bale, S. D., Chust, T., Krasnoselskikh, Kretzschmar, M., Lorfevre, E., Plettemeier, D., Soucek, J., Steller, M., Stverak, S., Vecchio, A., Horbury, T. S., O'Brien, H., Evans, Fedorov, A., Louarn, P., Genot, Andre, N., Lavraud, B., Rouillard, A. P., Owen, C. J.

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Investigation on the SEL Sensitive Depth of an SRAM Using Linear and Two-Photon Absorption Laser Testing von Faraud, E., Pouget, V., Shao, K., Larue, C., Darracq, F., Lewis, D., Samaras, A., Bezerra, F., Lorfevre, E., Ecoffet, R.

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Dose Rate Switching Technique on ELDRS-Free Bipolar Devices von Boch, J., Michez, A., Rousselet, M., Dhombres, S., Touboul, A. D., Vaille, J-R, Dusseau, L., Lorfevre, E., Chatry, N., Sukhaseum, N., Saigne, F.

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Radiation Belt Activity Indices and Solar Proton Event Alarm von Lazaro, D., Boscher, D., Bourdarie, S., Sicard-Piet, A., Rolland, G., Ecoffet, R., Lorfèvre, E.

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The Power Law Shape of Heavy Ions Experimental Cross Section von Wrobel, F., Touboul, A. D., Pouget, V., Dilillo, L., Lorfevre, E., Saigne, F.

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Unfolding JASON-2/ICARE-NG High-Energy Particles Measurements Using a Singular Value Decomposition Approach von Maget, V., Bourdarie, S., Lazaro, D., Boscher, D., Rolland, G., Ecoffet, R., Lorfevre, E.

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In-Flight Measurements of Radiation Environment on Board the Argentinean Satellite SAC-D von Boscher, D., Cayton, T., Maget, V., Bourdarie, S., Lazaro, D., Baldran, T., Bourdoux, P., Lorfevre, E., Rolland, G., Ecoffet, R.

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Correlation of In-Flight Displacement Damage on the OSL Sensor With Space Environment On-Board Jason-2 Spacecraft von Bourdarie, S., Falguere, D., Inguimbert, C., Deneau, C., Vaillé, J.-R, Lorfèvre, E., Ecoffet, R.

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Study of a Thermal Annealing Approach for Very High Total Dose Environments von Dhombres, S., Michez, A., Boch, J., Saigne, F., Beauvivre, S., Kraehenbuehl, D., Vaille, J.-R, Adell, P. C., Lorfevre, E., Ecoffet, R., Roig, F.

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On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive Operating Area Determination von Privat, A., Touboul, A. D., Michez, A., Bourdarie, S., Vaille, J. R., Wrobel, F., Chatry, N., Chaumont, G., Lorfevre, E., Bezerra, F., Saigne, F.

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Modeling dose effects in electronics devices: Dose and temperature dependence of power MOSFET von Michez, A., Boch, J., Dhombres, S., Saigné, F., Touboul, A.D., Vaillé, J.-R., Dusseau, L., Lorfèvre, E., Ecoffet, R.

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Post-Irradiation-Gate-Stress on Power MOSFETs: Quantification of Latent Defects-Induced Reliability Degradation von Privat, A., Touboul, A. D., Michez, A., Bourdarie, S., Vaille, J. R., Wrobel, F., Arinero, R., Chatry, N., Chaumont, G., Lorfevre, E., Saigne, F.

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Effect of Ion Energy on Power MOSFET's Oxide Reliability von Naceur, M., Touboul, A. D., Vaille, J. R., Lorfevre, E., Bezerra, F., Chaumont, G., Saigne, F.

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First In-Flight Data Analysis of Displacement Damage on the OSL Sensor On-Board CARMEN-2 von Deneau, C, Vaille, J-R, Dusseau, L, Mekki, J, Garcia, P, Bezerra, F, Lorfevre, E, Ecoffet, R

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First dust measurements with the Solar Orbiter Radio and Plasma Wave instrument von Zaslavsky, A., Mann, Soucek, J., Czechowski, A., Pisa, D., Vaverka, J., Meyer-Vernet, N., Maksimovic, M., Lorfevre, E., Issautier, K., Babic, K. Rackovic, Bale, S. D., Morooka, M., Vecchio, A., Chust, T., Khotyaintsev, Y., Krasnoselskikh, Kretzschmar, M., Plettemeier, D., Steller, M., Stverak, S., Travnicek, P., Vaivads, A.

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