A physical-based pMOSFETs threshold voltage model including the STI stress effect von 吴畏 杜刚 刘晓彦 孙雷 康晋峰 韩汝琦

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Comparison of band-to-band tunneling models in Si and Si-Ge junctions von 矫亦朋 魏康亮 王泰寰 杜刚 刘晓彦

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Influence of gate-source/drain misalignment on the performance of bulk FinFETs by a 3D full band Monte Carlo simulation von 王骏成 杜刚 魏康亮 曾琅 张兴 刘晓彦

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Simulation of carrier transport in heterostructures using the 2D self-consistent full-band ensemble Monte Carlo method von 魏康亮 刘晓彦 杜刚 韩汝琦

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Effect of trapped charge accumulation on the retention of charge trapping memory von Jin, Rui (锐金), Liu, Xiaoyan (晓彦 刘), Du, Gang (刚杜), Kang, Jinfeng (晋锋 康), Han, Ruqi (汝琦 韩)

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New Development of Reverse Micelles and Applications in Protein Separation and Refolding von 刘杨 董晓燕 孙彦

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