Experimental and theoretical studies of the build-up of an oxide layer during oxygen ion bombardment of silicon von Kilner, J.A., Littlewood, S.D., Badheka, R., Wadsworth, M., Van Den Berg, J.A., Armour, D.G.

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Determination of doping profiles on bevelled GaAs structures by Raman spectroscopy von Srnanek, R, Kinder, R, Sciana, B, Radziewicz, D, McPhail, D.S, Littlewood, S.D, Novotny, I

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A quantitative study of copper segregation in silicon under oxygen ion beam bombardment using SIMS von Kilner, J.A., McPhail, D.S., Littlewood, S.D.

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Examining the role of psychological factors in the relationship between sleep problems and suicide von Littlewood, D., Kyle, S.D., Pratt, D., Peters, S., Gooding, P.

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