Design of an offset-tolerant voltage sense amplifier bit-line sensing circuit for SRAM memories von Licciardo, G.D, Cappetta, C, Di Benedetto, L, Rubino, A

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An Analog Circuit for Accurate OCVD Measurements von Bellone, S., Licciardo, G.D.

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Experimental measurements of majority and minority carrier lifetime profile in SI epilayers by the use of an improved OCVD method von Bellone, S., Licciardo, G.D., Daliento, S., Mele, L.

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An Analytical Model of an OCVD-Based Measurement Technique of the Local Carrier Lifetime von Bellone, S., Licciardo, G.D., Guerriero, G., Rubino, A.

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Divanadium Pentoxide/4H-silicon Carbide: A Schottky Contact for Highly Linear Temperature Sensors von Rao, S., Pangallo, G., Di Benedetto, L., Rubino, A., Licciardo, G.D., Corte, F.G. Della

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Test structure design for measuring electron and hole mobilities at very high injection levels von Licciardo, G.D.

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Limitations of the Open-Circuit Voltage Decay technique applied to 4H-SiC diodes von Bellone, S., Albanese, L.F., Licciardo, G.D.

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Physical model, measurement setup and experiments of a measurement technique of the carrier lifetime profile in power devices von Bellone, S., Licciardo, G.D., Rubino, A., Petrosino, M.

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The effect of ITO surface energy on OLED electrical properties von Petrosino, M., Vacca, P., Licciardo, G.D., Rubino, A., Bellone, S.

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A novel measurement method of the spatial carrier lifetime profile based on the OCVD technique von Bellone, S., Licciardo, G.D., Neitzert, H.C.

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Investigation of the damage as induced by 1.7 MeV protons in an amorphous/crystalline silicon heterojunction solar cell von Neitzert, Heinz-Christoph, Spinillo, Patrizio, Bellone, Salvatore, Licciardi, Gian-Domenico, Tucci, Mario, Roca, Francesco, Gialanella, Lucio, Romano, Mario

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