Stress test measurements of lattice-matched InAlN/AlN/GaN HFET structures von Leach, Jacob H., Wu, Mo, Ni, Xianfeng, Li, Xing, Özgür, Ümit, Morkoç, Hadis, Liberis, Juozas, Šermukšnis, Emilis, Matulionis, Arvydas, Cheng, Hailing, Kurdak, Çagliyan, Moon, Yong-Tae

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