Investigation of a Sequential Three-Dimensional Process for Back-Illuminated CMOS Image Sensors With Miniaturized Pixels von Coudrain, P., Magnan, P., Batude, P., Gagnard, X., Leyris, C., Vinet, M., Castex, A., Lagahe-Blanchard, C., Pouydebasque, A., Cazaux, Y., Giffard, B., Ancey, P.

Volltext

0.13 \mu m SiGe BiCMOS Technology Fully Dedicated to mm-Wave Applications von Avenier, G., Diop, M., Chevalier, P., Troillard, G., Loubet, N., Bouvier, J., Depoyan, L., Derrier, N., Buczko, M., Leyris, C., Boret, S., Montusclat, S., Margain, A., Pruvost, S., Nicolson, S.T., Yau, K.H.K., Revil, N., Gloria, D., Dutartre, D., Voinigescu, S.P., Chantre, A.

Volltext

Low Frequency Noise in High Speed SiGe:C HBTs after Forward and Mixed-Mode Stress von Diop, Malick, Leyris, Cedric, Revil, Nathalie, Marin, Mathieu, Ghibaudo, Gerard

Volltext

I-V and Low frequency noise characterization of Polysilicon and Amorphous Ti- and Co- salicide resistors von Raoult, Jérémy, Pascal, Fabien, Leyris, Cédric

Volltext

Noise as a characterization tool for reliability under illumination of transfer gate transistor for image sensors applications von Lopez, D., Leyris, C., Ricq, S., Balestra, F.

Volltext

Mismatch Measure Improvement Using Kelvin Test Structures in Transistor Pair Configuration in Sub-Hundred Nanometer MOSFET Technology von Mezzomo, C.M., Marin, M., Leyris, C., Ghibaudo, G.

Volltext

Reliability review of 250 GHz fully self aligned heterojunction bipolar transistors for millimeterwave applications von Diop, M., Marin, M., Revil, N., Pourchon, F., Leyris, C., Chevalier, P., Ghibaudo, G.

Volltext

Investigation of a Sequential Three-Dimensional Process for Back-Illuminated CMOS Image : SOLID-STATE IMAGE SENSORS von COUDRAIN, Perceval, MAGNAN, Pierre, GIFFARD, Benoit, ANCEY, Pascal, BATUDE, Perrine, GAGNARD, Xavier, LEYRIS, Cédric, VINET, Maud, CASTEX, Arnaud, LAGAHE-BLANCHARD, Chrystelle, POUYDEBASQUE, Arnaud, CAZAUX, Yvon

Volltext

0.13 μm SiGe BiCMOS Technology Fully Dedicated to mm-Wave Applications : THE 2008 BIPOLAR/BICMOS CIRCUITS AND TECHNOLOGY MEETING von AVENIER, Grégory, DIOP, Malick, BORET, Samuel, MONTUSCLAT, Sébastien, MARGAIN, Alain, PRUVOST, Sébastien, NICOLSON, Sean T, YAU, Kenneth H. K, REVIL, Nathalie, GLORIA, Daniel, DUTARTRE, Didier, VOINIGESCU, Sorin P, CHEVALIER, Pascal, CHANTRE, Alain, TROILLARD, Germaine, LOUBET, Nicolas, BOUVIER, Julien, DEPOYAN, Linda, DERRIER, Nicolas, BUCZKO, Michel, LEYRIS, Cédric

Volltext

Low-frequency noise measurements as an investigation tool of pixel flickering in cooled Hg0.7Cd0.3Te focal plane arrays von PEREZ, Jean-Philippe, MYARA, Mikhael, ALABEDRA, Robert, ORSAL, Bernard, LEYRIS, Cédric, TOURRENC, Jean-Philippe, SIGNORET, Philippe

Volltext

Pockets engineering impact on mismatch performance on 45nm MOSFET technologies von Mezzomo, C.M., Leyris, C., Josse, E., Ghibaudo, G.

Volltext bestellen

Setting up 3D sequential integration for back-illuminated CMOS image sensors with highly miniaturized pixels with low temperature fully depleted SOI transistors von Coudrain, P., Batude, P., Gagnard, X., Leyris, C., Ricq, S., Vinet, M., Pouydebasque, A., Moussy, N., Cazaux, Y., Giffard, B., Magnan, P., Ancey, P.

Volltext