"Damage Free" Cleaning for Advanced BEOL Interconnections von Broussous, Lucile, Richard, Emmanuel, Pernel, Carole, Courouble, Kristell, Loup, Virginie, Lévy, Didier

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Silicon Chemical Oxide Growth by a Novel Wet Treatment in Aqueous Chlorine Solutions von CHEMLA, Marius, LEVY, Didier, PETITDIDIER, Sébastien, ROUELLE, François, ZANNA, Sandrine

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Zero Current Electrochemical Impedance Spectrometry for the Study of Si Substrate Depletion Layer von CHEMLA, Marius, BERTAGNA, Valérie, ROUELLE, François, PETTTDIDIER, Sébastien, LEVY, Didier

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SiGe Alloys Sensitivity to Front-End Surface Preparations von Briend, Guillaume, Garnier, Philippe, Jeanjean, Damien, Breil, Nicolas, Gourhant, Olivier, Dutartre, Didier, Tanon-Pellissier, Denis, Campidelli, Yves, Bidal, Gregory, Levy, Didier

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Two-material rail development: field test results regarding rolling contact fatigue and squeal noise behaviour von Hiensch, Martin, Larsson, Per-Olof, Nilsson, Olof, Levy, Didier, Kapoor, Ajay, Franklin, Francis, Nielsen, Jens, Ringsberg, Jonas W., Josefson, B. Lennart

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Comparison between time and frequency studies of a corrugated curve of RER Paris network von Collette, C., Vanhonacker, P., Bastaits, R., Levy, D.

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Two-material rail development: field test results regarding rolling contact fatigue and squeal behaviour von Hiensch, Martin, Larsson-Kråik, Per-Olof, Nilsson, Olof, Levy, Didier, Kapoor, Ajay, Franklin, Francis, Nielsen, Jens, Ringsberg, Jonas W., Josefsson, B. Lennart

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Chimie et technologies de l'information von Cayrefourcq, Ian

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Single-wafer/mini-batch approach for fast cycle time in advanced 300-mm fab von Bonnin, O., Mercier, D., Levy, D., Henry, M., Pouilloux, I., Mastromatteo, E.

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Single-wafer/mini-batch approach for fast cycle time in advanced 300-mm fab : Single-wafer manufacturing in the nanochip era von BONNIN, Olivier, MERCIER, Dominique, LEVY, Didier, HENRY, Martin, POUILLOUX, Isabelle, MASTROMATTEO, Eric

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Metallic Contamination Removal Evaluation for Single Wafer Processing von Boelen, Pieter, Levy, Didier, Garnier, Philippe, Verhaverbeke, Steven, Morinaga, Hitoshi

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Electrochemical impedance spectroscopy as a probe for wet chemical silicon oxide characterization von Bertagna, Valérie, Erre, René, Rouelle, François, Lévy, Didier, Petitdidier, Sébastien, Chemla, Marius

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Photoresist Adhesion during Wet Etch on Single Wafer Tool von Gomez, Y., Garnier, Philippe, Torres, Alphonse, Pernet, B., Duluard, C., Lévy, Didier, Gatefait, M., Barge, David

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Chimie et technologies de l'information von Ian Cayrefourcq, Isabelle Chartier, Bertrand Demotes-Mainard, Sébastien Février, Jean-Charles Flores, Lionel Hirsch, Anatole Lécuyer, Yannick Le Tiec, Didier Lévy, Lionel Presmanes, Patrice Simon, Vincent Thulliez, Michel Valache

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Neutron reflectivity study of ultrathin SiO2 on Si von Bertagna, Valérie, Erre, René, Saboungi, Marie-Louise, Petitdidier, Sébastien, Lévy, Didier, Menelle, Alain

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Installation of rail on concrete foundation - comprises two vibration damping stages, first placing resilient bed plate under rail foot, secondly placing single saddle supporting r... von LEVY DIDIER

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Surface Preparation Challenge on Nitrided Gate Oxides von Garnier, Philippe, Lévy, Didier, Cabuil, Nicolas, Barla, Kathy, Tavel, Brice, Barge, David, Bienacel, Jerome

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IDR2-Novum promises lower rail maintenance costs von Girardi, Louis, Heyder, Rene, Levy, Didier, Boulanger, Daniel

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Method for manufacturing a semiconductor device and semiconductor device obtainable with such a method von LAGHA ANISSA, LEVY DIDIER, FOX ROBERT, BROUSSOUS LUCILE

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SiGe Alloys Sensitivity to Front-End Surface Preparation von Briend, Guillaume, Garnier, Philippe, Jeanjean, Damien, Tanon-Pellissier, Denis, Campidelli, Yves, Breil, Nicolas, Gourhant, Olivier, Bidal, Gregory, Levy, Didier

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