Time-resolved surface expansion of metals under picosecond laser illumination von Levy, Ady, Amer, Nabil M.

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Government's credit-rating concerns and the evaluation of public projects von Levy, Nadav, Pauzner, Ady

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Supporting Transition to the Bereaved Community After the Death of a Child von Levy, Carly, Drouin, Kristin, Dorsett, Ady, Sood, Erica

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Thermodynamic properties of a quantum Hall anti-dot interferometer von Levy Schreier, Sarah, Stern, Ady, Rosenow, Bernd, Halperin, Bertrand I.

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SYSTEM AND METHOD FOR PROCESS-INDUCED DISTORTION PREDICTION DURING WAFER DEPOSITION von LEVY, Ady, SMITH, Mark D

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System and method for process-induced distortion prediction during wafer deposition von Levy, Ady, Smith, Mark D

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SYSTEM AND METHOD FOR PROCESS-INDUCED DISTORTION PREDICTION DURING WAFER DEPOSITION von LEVY, Ady, SMITH, Mark D

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SYSTEM AND METHOD FOR TILT CALCULATION BASED ON OVERLAY METROLOGY MEASUREMENTS von MACDONALD, Paul, PEI, Jincheng, SONG, Jinyan, LEVY, Ady, VOLKOVICH, Roie, MANASSEN, Amnon

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System and Method for Process-Induced Distortion Prediction During Wafer Deposition von Smith Mark D, Levy Ady

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SYSTEM AND METHOD FOR PROCESS-INDUCED DISTORTION PREDICTION DURING WAFER DEPOSITION von LEVY, Ady, SMITH, Mark D

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Process-induced displacement characterization during semiconductor production von Levy, Ady, Dighe, Prasanna, Mueller, Dieter, Vukkadala, Pradeep, Smith, Mark D

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SYSTEM AND METHOD FOR TILT CALCULATION BASED ON OVERLAY METROLOGY MEASUREMENTS von MACDONALD, Paul, PEI, Jincheng, SONG, Jinyan, LEVY, Ady, VOLKOVICH, Roie, MANASSEN, Amnon

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System and method for tilt calculation based on overlay metrology measurements von Song, Jinyan, Levy, Ady, Manassen, Amnon, Pei, Jincheng, MacDonald, Paul, Volkovich, Roie

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Process-Induced Displacement Characterization During Semiconductor Production von Levy, Ady, Dighe, Prasanna, Mueller, Dieter, Vukkadala, Pradeep, Smith, Mark D

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Process-induced displacement characterization during semiconductor production von Levy, Ady, Dighe, Prasanna, Mueller, Dieter, Vukkadala, Pradeep, Smith, Mark D

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SYSTEM AND METHOD FOR TILT CALCULATION BASED ON OVERLAY METROLOGY MEASUREMENTS von MACDONALD, Paul, PEI, Jincheng, SONG, Jinyan, LEVY, Ady, VOLKOVICH, Roie, MANASSEN, Amnon

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SYSTEM AND METHOD FOR TILT CALCULATION BASED ON OVERLAY METROLOGY MEASUREMENTS von Song, Jinyan, Levy, Ady, Manassen, Amnon, Pei, Jincheng, MacDonald, Paul, Volkovich, Roie

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SYSTEM AND METHOD FOR TILT CALCULATION BASED ON OVERLAY METROLOGY MEASUREMENTS von MACDONALD, Paul, PEI, Jincheng, SONG, Jinyan, LEVY, Ady, VOLKOVICH, Roie, MANASSEN, Amnon

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PROCESS-INDUCED DISPLACEMENT CHARACTERIZATION DURING SEMICONDUCTOR PRODUCTION von MUELLER, Dieter, LEVY, Ady, VUKKADALA, Pradeep, DIGHE, Prasanna, SMITH, Mark D

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MODEL-BASED HOT SPOT MONITORING von KAPASI, Sanjay, LEVY, Ady, PANDEV, Stilian, SMITH, Mark D

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