Teaching Teachers to Teach Engineering-T4E von Conley, Christopher H., Ressler, Stephen J., Lenox, Thomas A., Samples, Jerry W.

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Teaching Teachers to Teach Engineering—T 4 E von Conley, Christopher H., Ressler, Stephen J., Lenox, Thomas A., Samples, Jerry W.

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The Army's Pipeline for Technological Officers: Is It Broken von Lenox, Thomas A

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Oxygen vacancy contributions to the electrical stress response and endurance of ferroelectric hafnium zirconium oxide thin films von Mallick, Antik, Lenox, Megan K., Beechem, Thomas E., Ihlefeld, Jon F., Shukla, Nikhil

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CSR Needs CPR: Corporate Sustainability and Politics von Lyon, Thomas P., Delmas, Magali A., Maxwell, John W., Bansal, Pratima (Tima), Chiroleu-Assouline, Mireille, Crifo, Patricia, Durand, Rodolphe, Gond, Jean-Pascal, King, Andrew, Lenox, Michael, Toffel, Michael, Vogel, David, Wijen, Frank

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Pulmonary lymphangitic carcinomatosis as a primary manifestation of colon cancer in a young adult von Thomas, Anish, MD, Lenox, Robert, MD

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Phase Transformations Driving Biaxial Stress Reduction During Wake‐Up of Ferroelectric Hafnium Zirconium Oxide Thin Films von Jaszewski, Samantha T., Fields, Shelby S., Calderon, Sebastian, Aronson, Benjamin L., Beechem, Thomas E., Kelley, Kyle P., Zhang, Casey, Lenox, Megan K., Brummel, Ian A., Dickey, Elizabeth C., Ihlefeld, Jon F.

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Immature myeloid cells directly contribute to skin tumor development by recruiting IL-17-producing CD4+ T cells von Ortiz, Myrna L, Kumar, Vinit, Martner, Anna, Mony, Sridevi, Donthireddy, Laxminarasimha, Condamine, Thomas, Seykora, John, Knight, Stella C, Malietzis, George, Lee, Gui Han, Moorghen, Morgan, Lenox, Brianna, Luetteke, Noreen, Celis, Esteban, Gabrilovich, Dmitry

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Phase Transformations Driving Biaxial Stress Reduction During Wake-Up of Ferroelectric Hafnium Zirconium Oxide Thin Films von Jaszewski, Samantha T., Fields, Shelby S., Calderon, Sebastian, Aronson, Benjamin L., Beechem, Thomas E., Kelley, Kyle P., Zhang, Casey, Lenox, Megan K., Brummel, Ian A., Dickey, Elizabeth C., Ihlefeld, Jon F.

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Motion compensation in histogram-mode and list-mode EM reconstructions: beyond the event-driven approach von Rahmim, A., Bloomfield, P., Houle, S., Lenox, M., Michel, C., Buckley, K.R., Ruth, T.J., Sossi, V.

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CSR Needs CPR: Corporate Sustainability and Politics von Lyon, Thomas P, Delmas, Magali A, Maxwell, John W, Bansal, Pratima (Tima), Chiroleu-Assouline, Mireille, Crifo, Patricia, Durand, Rodolphe, Gond, Jean-Pascal, King, Andrew, Lenox, Michael, Toffel, Michael, Vogel, David, Wijen, Frank

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Self-Regulation and Regulatory Discretion: Why Firms May Be Reluctant to Signal Green von Lyon, Thomas P., Maxwell, John W.

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Management strategy and the environment von Lyon, Thomas P

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SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES von LENOX, Chet, VON DEN HOFF, Mike, PRICE, David, W, DONZELLA, Oreste, ROBINSON, John, GROOS, Thomas, NARASIMHAN, Narayani, LIM, Teng, Song, LACH, Justin, SHERMAN, Kara, SAVILLE, Barry, RATHERT, Robert, J

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IMAGING REFLECTOMETRY FOR INLINE SCREENING von VON DEN HOFF, Mike, PRICE, David W, DONZELLA, Oreste, GROOS, Thomas, ROBINSON, John Charles, LENOX, Chet V, LACH, Justin, PANDEV, Stilian, SAVILLE, Barry, LI, Shifang, RATHERT, Robert J

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SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES von LENOX, Chet, VON DEN HOFF, Mike, PRICE, David, W, DONZELLA, Oreste, ROBINSON, John, GROOS, Thomas, NARASIMHAN, Narayani, LIM, Teng, Song, LACH, Justin, SHERMAN, Kara, SAVILLE, Barry, RATHERT, Robert, J

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IMAGING REFLECTOMETRY FOR INLINE SCREENING von Groos, Thomas, Rathert, Robert J, Donzella, Oreste, Lach, Justin, Price, David W, Robinson, John Charles, Lenox, Chet V, Pandev, Stilian, Von Den Hoff, Mike, Saville, Barry, Li, Shifang

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SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES von LENOX, Chet, VON DEN HOFF, Mike, LIM, Teng, DONZELLA, Oreste, ROBINSON, John, RATHERT, Robert, GROOS, Thomas, NARASIMHAN, Narayani, PRICE, David, LACH, Justin, SHERMAN, Kara, SAVILLE, Barry

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IMAGING REFLECTOMETRY FOR INLINE SCREENING von VON DEN HOFF, Mike, PRICE, David W, DONZELLA, Oreste, GROOS, Thomas, ROBINSON, John Charles, LENOX, Chet V, LACH, Justin, PANDEV, Stilian, SAVILLE, Barry, LI, Shifang, RATHERT, Robert J

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SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES von Robinson, John, Groos, Thomas, Lim, Teng Song, Rathert, Robert J, Donzella, Oreste, Lach, Justin, Price, David W, Sherman, Kara L, Lenox, Chet V, Narasimhan, Narayani, Von Den Hoff, Mike, Saville, Barry

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