Local crystallographic phase detection and texture mapping in ferroelectric Zr doped HfO2 films by transmission-EBSD von Lederer, M., Kämpfe, T., Olivo, R., Lehninger, D., Mart, C., Kirbach, S., Ali, T., Polakowski, P., Roy, L., Seidel, K.

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Crystalline phase control of ferroelectric HfO2 thin film via heterogeneous co-doping von Yang, S., Lehninger, D., Sünbül, A., Schöne, F., Reck, A., Seidel, K., Gerlach, G., Lederer, M.

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Evidence for ferroelastic switching and nanoscopic domains in polycrystalline Si-doped hafnium oxide films von Lederer, M., Mart, C., Kämpfe, T., Lehninger, D., Seidel, K., Czernohorsky, M., Weinreich, W., Volkmann, B., Eng, L. M.

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Formation of orthorhombic (Zr,Ta)O2 in thin Zr-Ta-O films von Lehninger, D., Rafaja, D., Wünsche, J., Schneider, F., von Borany, J., Heitmann, J.

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Endurance Study of Silicon-Doped Hafnium Oxide (HSO) and Zirconium-Doped Hafnium Oxide (HZO)-Based FeFET Memory von Duhan, P., Ali, T., Khedgarkar, P., Kuhnel, K., Czernohorsky, M., Rudolph, M., Hoffmann, R., Sunbul, A., Lehninger, D., Schramm, P., Kampfe, T., Seidel, K.

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Size- and position-controlled Ge nanocrystals separated by high-k dielectrics von Lehninger, D., Honeit, F., Rafaja, D., Klemm, V., Röder, C., Khomenkova, L., Schneider, F., von Borany, J., Heitmann, J.

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A Study on the Temperature-Dependent Operation of Fluorite-Structure-Based Ferroelectric HfO2 Memory FeFET: Pyroelectricity and Reliability von Ali, T., Kuhnel, K., Czernohorsky, M., Mart, C., Rudolph, M., Patzold, B., Lehninger, D., Olivo, R., Lederer, M., Muller, F., Hoffmann, R., Metzger, J., Binder, R., Steinke, P., Kampfe, T., Muller, J., Seidel, K., Eng, L. M.

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A Study on the Temperature-Dependent Operation of Fluorite-Structure-Based Ferroelectric HfO2 Memory FeFET: A Temperature-Modulated Operation von Ali, T., Kuhnel, K., Czernohorsky, M., Mart, C., Rudolph, M., Patzold, B., Lederer, M., Olivo, R., Lehninger, D., Muller, F., Hoffmann, R., Metzger, J., Binder, R., Steinke, P., Kampfe, T., Muller, J., Seidel, K., Eng, L. M.

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Charge trapping of Ge-nanocrystals embedded in TaZrOx dielectric films von Lehninger, D., Seidel, P., Geyer, M., Schneider, F., Klemm, V., Rafaja, D., von Borany, J., Heitmann, J.

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Effect of Ge Content on the Formation of Ge Nanoclusters in Magnetron-Sputtered GeZrOx-Based Structures von Khomenkova, L., Lehninger, D., Kondratenko, O., Ponomaryov, S., Gudymenko, O., Tsybrii, Z., Yukhymchuk, V., Kladko, V., von Borany, J., Heitmann, J.

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Size and Shape Controlled Semiconductor Nanocrystals Synthesized by RF-Sputtering Techniques for Electronic and Optoelectronic Applications von Lehninger, D., Beyer, J., Schneider, F., Pawlik, A.-S., Heitmann, J.

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A Study on the Temperature-Dependent Operation of Fluorite-Structure-Based Ferroelectric HfO 2 Memory FeFET: A Temperature-Modulated Operation von Ali, T., Kuhnel, K., Czernohorsky, M., Mart, C., Rudolph, M., Patzold, B., Lederer, M., Olivo, R., Lehninger, D., Muller, F., Hoffmann, R., Metzger, J., Binder, R., Steinke, P., Kampfe, T., Muller, J., Seidel, K., Eng, L. M.

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A Study on the Temperature-Dependent Operation of Fluorite-Structure-Based Ferroelectric HfO 2 Memory FeFET: Pyroelectricity and Reliability von Ali, T., Kuhnel, K., Czernohorsky, M., Mart, C., Rudolph, M., Patzold, B., Lehninger, D., Olivo, R., Lederer, M., Muller, F., Hoffmann, R., Metzger, J., Binder, R., Steinke, P., Kampfe, T., Muller, J., Seidel, K., Eng, L. M.

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Optical properties of Zr and ZrO2 von Petrik, P., Sulyok, A., Novotny, T., Perez-Feró, E., Kalas, B., Agocs, E., Lohner, T., Lehninger, D., Khomenkova, L., Nagy, R., Heitmann, J., Menyhard, M., Hózer, Z.

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Optical and structural characterization of Ge clusters embedded in ZrO2 von Agocs, E., Zolnai, Z., Rossall, A.K., van den Berg, J.A., Fodor, B., Lehninger, D., Khomenkova, L., Ponomaryov, S., Gudymenko, O., Yukhymchuk, V., Kalas, B., Heitmann, J., Petrik, P.

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Charge trapping of Ge-nanocrystals embedded in TaZrO{sub x} dielectric films von Lehninger, D., Seidel, P., Geyer, M., Schneider, F., Heitmann, J., Klemm, V., Rafaja, D., Borany, J. von

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Effect of Ge Content on the Formation of Ge Nanoclusters in Magnetron-Sputtered GeZrO x -Based Structures von Khomenkova, L, Lehninger, D, Kondratenko, O, Ponomaryov, S, Gudymenko, O, Tsybrii, Z, Yukhymchuk, V, Kladko, V, von Borany, J, Heitmann, J

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Effect of Ge Content on the Formation of Ge Nanoclusters in Magnetron-Sputtered GeZrO^sub x^-Based Structures von Khomenkova, L, Lehninger, D, Kondratenko, O, Ponomaryov, S, Gudymenko, O, Tsybrii, Z, Yukhymchuk, V, Kladko, V, von Borany, J, Heitmann, J

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Ge Nanostructures Embedded in ZrO2 Dielectric Films for Nonvolatile Memory Applications von Lehninger, D., Khomenkova, L., Röder, C., Gärtner, G., Abendroth, B., Beyer, J., Schneider, F., Meyer, D.C., Heitmann, J.

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Ge Nanostructures Embedded in ZrO 2 Dielectric Films for Nonvolatile Memory Applications von Lehninger, D., Khomenkova, L., Röder, C., Gärtner, G., Abendroth, B., Beyer, J., Schneider, F., Meyer, D.C., Heitmann, J.

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