Measurement of piezoelectric coefficients of ferroelectric thin films von Lefki, K., Dormans, G. J. M.

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Photoelectric study of β-FeSi2 on silicon : optical threshold as a function of temperature von LEFKI, K, MURET, P

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Optical and electrical characterization of β-FeSi2 epitaxial thin films on silicon substrates von LEFKI, K, MURET, P, CHERIEF, N, CINTI, R. C

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Infrared and Raman characterization of beta iron silicide von Lefki, K., Muret, P., Bustarret, E., Boutarek, N., Madar, R., Chevrier, J., Derrien, J., Brunel, M.

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The failure behavior of the anchorage of hairs during slow extraction von Roersma, M.E., Douven, L.F.A., Lefki, K., Oomens, C.W.J.

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Internal photoemission in metal/β-FeSi2/Si heterojunctions von LEFKI, K, MURET, P

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Band discontinuities at beta -FeSi2/Si heterojunctions as deduced from their photoelectric and electrical properties von Muret, P, Lefki, K, Nguyen, T T A, Cola, A, Ali, I

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The influence of growth techniques on the structure of epitaxial ErSi1.7 on Si(111) von LOLLMAN, D. B. B, NGUYEN TAN, T. A, VEUILLEN, J.-Y, MURET, P, LEFKI, K, BRUNEL, M, DUPUY, J. C

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Electrical and photoelectrical properties of ErSi1.7/Si junctions von Muret, P., von Blanckenhagen, G., Lefki, K., Tan, T.A.Nguyen, Lollman, D.

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Comment on ‘‘Effect of sub-band-gap illumination on β-FeSi2/ n -type Si diodes under reverse bias’’ von Muret, P., Lefki, K.

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Infrared and electrical properties of thin films and junctions of β-FeSi2 von LEFKI, K, MURET, P, CHERIEF, N, BUSTARRET, E, NGUYEN, T. T. A, BOUTAREK, N, MADAR, R, CHEVRIER, J, DERRIEN, J, BRUNEL, M

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Internal photoemission in metal/ beta -FeSi sub(2)/Si heterojunctions von Lefki, K, Muret, P

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Internal photoemission in metal/β-FeSi 2/Si heterojunctions von Lefki, K., Muret, P.

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Band discontinuities at beta -FeSi 2 /Si heterojunctions as deduced from their photoelectric and electrical properties von Muret, P, Lefki, K, Nguyen, T T A, Cola, A, Ali, I

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Electrical and photoelectrical properties of ErSi 1.7/Si junctions von Muret, P., von Blanckenhagen, G., Lefki, K., Tan, T.A.Nguyen, Lollman, D.

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Electrical and photoelectrical properties of ErSi sub(1.7)/Si junctions von Muret, P, von Blanckenhagen, G, Lefki, K, Tan, T A Nguyen, Lollman, D

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The influence of growth techniques on the structure of epitaxial ErSi 1.7 on Si(111) von Lollman, D.B.B., Nguyen Tan, T.A., Veuillen, J.-Y., Muret, P., Lefki, K., Brunel, M., Dupuy, J.C.

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Influence of growth techniques on the structure of epitaxial ErSi sub(1.7) on Si(111) von Lollman, D B B, Tan, T A Nguyen, Veuillen, J-Y, Muret, P, Lefki, K, Brunel, M, Dupuy, J C

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Infrared and electrical properties of thin films and junctions of β-FeSi 2 von Lefki, K., Muret, P., Cherief, N., Bustarret, E., Nguyen, T.T.A., Boutarek, N., Madar, R., Chevrier, J., Derrien, J., Brunel, M.

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Wet shaver with retractile action von P.H. DELEEUW, K. LEFKI, A.J. GARENFELD

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