Anomalous Gate-Edge Leakage Induced by High Tensile Stress in NMOSFET von LIU, Po-Tsun, HUANG, Chen-Shuo, LIM, Peng-Soon, LEE, Da-Yuan, TSAO, Shueh-Wen, CHEN, Chi-Chun, TAO, Hun-Jan, MII, Yuh-Jier

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Post-soft-breakdown characteristics of deep submicron NMOSFETs with ultrathin gate oxide von Tsai, Min-Yu, Lin, Horng-Chih, Lee, Da-Yuan, Huang, Tiao-Yuan

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Breakdown Modes and Their Evolution in Ultrathin Gate Oxide von Lin, Horng-Chih, Lee, Da-Yuan, Huang, Tiao-Yuan

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Enhanced Negative-Bias-Temperature Instability of P-Channel Metal-Oxide-Semiconductor Transistors due to Plasma Charging Damage von Lee, Da-Yuan, Lin, Horng-Chih, Wang, Meng-Feng, Tsai, Min-Yu, Huang, Tiao-Yuan, Wang, Tahui

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Effects of process and gate doping species on negative-bias-temperature instability of p-channel MOSFETs von LEE, Da-Yuan, HUANG, Tiao-Yuan, LIN, Horng-Chih, CHIANG, Wan-Ju, HUANG, Guo-Wei, TAHUI WANG

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Novel Silicon Surface Pre-Treatment (SSPT) Technique for CMOS Device Performance Boosting von Da-Yuan Lee, Chen, C.C., Huang, C.H., Lim, P.S., Chan, M.H., Yeh, M.S., Huang, C.S., Tao, H.J., Mii, Y.J.

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NANOSHEET CHANNEL FORMATION METHOD AND STRUCTURE von Lee, Da-Yuan, Chang, Weng

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Semiconductor Device and Method of Forming the Same von Lin, Kuei-Lun, Lee, Da-Yuan, Lee, Hsin-Hua

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SEMICONDUCTOR DEVICE von Lee, Da-Yuan, Lee, Hsin-Yi, Hung, Cheng-Lung

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Method of forming semiconductor device von Lee, Da-Yuan, Lee, Hsin-Yi, Hung, Cheng-Lung

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Semiconductor Device and Method of Forming the Same von Lin, Kuei-Lun, Lee, Da-Yuan, Lee, Hsin-Hua

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SEMICONDUCTOR DEVICE AND METHODS OF FORMING THE SAME von Lee, Da-Yuan, Lin, Cheng-I, Chui, Chi On

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SELECTIVE ETCHING TO INCREASE THRESHOLD VOLTAGE SPREAD von Su, Ching-Hwanq, Lee, Da-Yuan, Lee, Hsin-Yi, Li, Ya-Huei

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METHOD OF FORMING SEMICONDUCTOR DEVICE von Lee, Da-Yuan, Lee, Hsin-Yi, Hung, Cheng-Lung

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TRANSISTOR GATE STRUCTURES von Chang, Che-Hao, Lee, Da-Yuan, Hou, Cheng-Hao, Chui, Chi On

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SEMICONDUCTOR DEVICE STRUCTURE WITH GATE AND METHOD FOR FORMING THE SAME von CHUI, Chi On, CHEN, Yen-Fu, LIN, Tsung-Da, LIN, Kuei-Lun, LEE, Da-Yuan

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CONTROLLING THRESHOLD VOLTAGES THROUGH BLOCKING LAYERS von Lee, Chia-Ching, Chiu, Shih-Hang, Lee, Da-Yuan, Wu, Chung-Chiang, Tung, Hsuan-Yu

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Semiconductor device von Lee, Da-Yuan, Lee, Hsin-Yi, Hung, Cheng-Lung

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Treatment of Electrodes of MIM Capacitors von Lee, Da-Yuan, Tsai, Shin-Hung, Hou, Cheng-Hao, Chui, Chi On

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Treatment of Electrodes of MIM Capacitors von Chiang, Chun-Hsiu, Lee, Da-Yuan, Tsai, Shin-Hung, Hou, Cheng-Hao, Chui, Chi On

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