High-frequency gas effusion through nanopores in suspended graphene von Rosłoń, I. E., Dolleman, R. J., Licona, H., Lee, M., Šiškins, M., Lebius, H., Madauß, L., Schleberger, M., Alijani, F., van der Zant, H. S. J., Steeneken, P. G.

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Nanostructuring graphene by dense electronic excitation von Ochedowski, O, Lehtinen, O, Kaiser, U, Turchanin, A, Ban-d'Etat, B, Lebius, H, Karluši, M, Jakši, M, M Schleberger

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Creating nanoporous graphene with swift heavy ions von Vázquez, H., Åhlgren, E.H., Ochedowski, O., Leino, A.A., Mirzayev, R., Kozubek, R., Lebius, H., Karlušic, M., Jakšic, M., Krasheninnikov, A.V., Kotakoski, J., Schleberger, M., Nordlund, K., Djurabekova, F.

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Response of GaN to energetic ion irradiation: conditions for ion track formation von Karluši, M, Kozubek, R, Lebius, H, Ban-d'Etat, B, Wilhelm, R A, Buljan, M, Siketi, Z, Scholz, F, Meisch, T, Jakši, M, Bernstorff, S, Schleberger, M, Šanti, B

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Time-of-flight mass spectrometry of particle emission during irradiation with slow, highly charged ions von Skopinski, L., Ernst, P., Herder, M., Kozubek, R., Madauß, L., Sleziona, S., Maas, A., Königstein, N., Lebius, H., Wucher, A., Schleberger, M.

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Unzipping and folding of graphene by swift heavy ions von Akcöltekin, S., Bukowska, H., Peters, T., Osmani, O., Monnet, I., Alzaher, I., d'Etat, B. Ban, Lebius, H., Schleberger, M.

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Swift heavy ion track formation in SrTiO3 and TiO2 under random, channeling and near-channeling conditions von Karluši, M, Jakši, M, Lebius, H, Ban-d'Etat, B, Wilhelm, R A, Heller, R, Schleberger, M

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A new setup for the investigation of swift heavy ion induced particle emission and surface modifications von Meinerzhagen, F., Breuer, L., Bukowska, H., Bender, M., Severin, D., Herder, M., Lebius, H., Schleberger, M., Wucher, A.

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Measurements and 3D Monte Carlo simulation of MeV ion transmission through conical glass capillaries von Simon, M.J., Zhou, C.L., Döbeli, M., Cassimi, A., Monnet, I., Méry, A., Grygiel, C., Guillous, S., Madi, T., Benyagoub, A., Lebius, H., Müller, A.M., Shiromaru, H., Synal, H.-A.

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Charge-state related effects in sputtering of LiF by swift heavy ions von Assmann, W., Ban-d'Etat, B., Bender, M., Boduch, P., Grande, P.L., Lebius, H., Lelièvre, D., Marmitt, G.G., Rothard, H., Seidl, T., Severin, D., Voss, K.-O., Toulemonde, M., Trautmann, C.

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Online in situ x-ray diffraction setup for structural modification studies during swift heavy ion irradiation von Grygiel, C., Lebius, H., Bouffard, S., Quentin, A., Ramillon, J. M., Madi, T., Guillous, S., Been, T., Guinement, P., Lelièvre, D., Monnet, I.

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Damage in graphene due to electronic excitation induced by highly charged ions von Hopster, J, Kozubek, R, Ban-d'Etat, B, Guillous, S, Lebius, H, Schleberger, M

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Track formation in two amorphous insulators, vitreous silica and diamond like carbon: Experimental observations and description by the inelastic thermal spike model von Rotaru, C., Pawlak, F., Khalfaoui, N., Dufour, C., Perrière, J., Laurent, A., Stoquert, J.P., Lebius, H., Toulemonde, M.

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Damage in crystalline silicon by swift heavy ion irradiation von Osmani, O., Alzaher, I., Peters, T., Ban d’Etat, B., Cassimi, A., Lebius, H., Monnet, I., Medvedev, N., Rethfeld, B., Schleberger, M.

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A new setup for localized implantation and live-characterization of keV energy multiply charged ions at the nanoscale von Guillous, S., Bourin, C., Ban D’Etat, B., Benyagoub, A., Cassimi, A., Feierstein, C., Gardés, E., Giglio, E., Girard, S., Grygiel, C., Houel, A., Lebius, H., Méry, A., Monnet, I., Ramillon, J.-M., Rangama, J., Ropars, F., Verzeroli, E., Viteau, M., Delobbe, A.

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Nanostructure formation due to impact of highly charged ions on mica von Ritter, R., Kowarik, G., Meissl, W., El-Said, A.S., Maunoury, L., Lebius, H., Dufour, C., Toulemonde, M., Aumayr, F.

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An innovative experimental setup for the measurement of sputtering yield induced by keV energy ions von Salou, P, Lebius, H, Benyagoub, A, Langlinay, T, Lelièvre, D, Ban-d'Etat, B

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Patterning of insulating surfaces by electronic excitation von Akcöltekin, S., Akcöltekin, E., Roll, T., Lebius, H., Schleberger, M.

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Interaction of swift ion beams with surfaces: Sputtering of secondary ions from LiF studied by XY-TOF-SIMS von Hijazi, H., Rothard, H., Boduch, P., Alzaher, I., Ropars, F., Cassimi, A., Ramillon, J.M., Been, T., d’Etat, B. Ban, Lebius, H., Farenzena, L.S., da Silveira, E.F.

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Nano-structure formation due to impact of highly charged ions on HOPG von Ritter, R., Kowarik, G., Meissl, W., Süss, L., Maunoury, L., Lebius, H., Dufour, C., Toulemonde, M., Aumayr, F.

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