Fundamental Principles of Engineering Nanometrology von Leach, Richard

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Three-dimensional resonating metamaterials for low-frequency vibration attenuation von Elmadih, W., Chronopoulos, D., Syam, W. P., Maskery, I., Meng, H., Leach, R. K.

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X-ray computed tomography for additive manufacturing: a review von Thompson, A, Maskery, I, Leach, R K

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In-situ measurement and monitoring methods for metal powder bed fusion: an updated review von Grasso, M., Remani, A., Dickins, A., Colosimo, B. M., Leach, R. K.

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On-machine and in-process surface metrology for precision manufacturing von Gao, W., Haitjema, H., Fang, F.Z., Leach, R.K., Cheung, C.F., Savio, E., Linares, J.M.

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Invited Review Article: Review of post-process optical form metrology for industrial-grade metal additive manufactured parts von Stavroulakis, P. I., Leach, R. K.

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Quantification and characterisation of porosity in selectively laser melted Al–Si10–Mg using X-ray computed tomography von Maskery, I., Aboulkhair, N.T., Corfield, M.R., Tuck, C., Clare, A.T., Leach, R.K., Wildman, R.D., Ashcroft, I.A., Hague, R.J.M.

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Autonomous image background removal for accurate and efficient close-range photogrammetry von Eastwood, J, Leach, R K, Piano, S

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Surface measurement errors using commercial scanning white light interferometers von Gao, F, Leach, R K, Petzing, J, Coupland, J M

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Characterisation of a multi-view fringe projection system based on the stereo matching of rectified phase maps von Shaheen, A, Sims-Waterhouse, D, Bointon, P, Takushima, S, Piano, S, Leach, R K

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Industrial X-Ray Computed Tomography von Carmignato, Simone, Dewulf, Wim, Leach, Richard

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A review of the existing performance verification infrastructure for micro-CMMs von Claverley, J.D., Leach, R.K.

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Precision Metal Additive Manufacturing von Leach, Richard, Carmignato, Simone

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Surface measurement errors using commercial scanning white light interferometers von Gao, F, Leach, R K, Petzing, J, Coupland, J M

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Precision additive metal manufacturing von Leach, Richard, Carmignato, Simone

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Shape descriptors and statistical classification on areal topography data for tile inspection in tessellated surfaces von Senin, N., Moretti, M., Leach, R.K.

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Development of a new traceable areal surface texture measuring instrument von Leach, R.K., Flack, D.R., Hughes, E.B., Jones, C.W.

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An analysis of type F2 software measurement standards for profile surface texture parameters von Todhunter, L D, Leach, R K, Lawes, S D A, Blateyron, F

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Intelligent sampling for the measurement of structured surfaces von Wang, J, Jiang, X, Blunt, L A, Leach, R K, Scott, P J

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Assessment of surface topography modifications through feature-based registration of areal topography data von Moretti, M, Gambucci, G, Leach, R K, Senin, N

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