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  1. 1
    Micro-Raman, SEM, XPS, and electron field emission characterizations of nitrogen-induced shallow defects on nanodiamond films fabricated with different growth parameters

    Micro-Raman, SEM, XPS, and electron field emission characterizations of nitrogen-induced shallow defects on nanodiamond films fabricated with different growth parameters von LeQuan, X.C., Kang, W.P., Davidson, J.L., Guo, M., Choi, B.K.

    Veröffentlicht in Diamond and related materials

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  2. 2
    Nanodiamod lateral device field emission diode fabricated by electron beam lithography

    Nanodiamod lateral device field emission diode fabricated by electron beam lithography von LeQuan, X.C., Choi, B.K., Kang, W.P., Davidson, J.L.

    Veröffentlicht in Diamond and related materials

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  3. 3
    Effect of rearranging sp 2/sp 3 hybridized-bonding on the field emission characteristics of nano-crystalline diamond films

    Effect of rearranging sp 2/sp 3 hybridized-bonding on the field emission characteristics of nano-crystalline diamond films von LeQuan, X.C., Kang, W.P., Davidson, J.L., Choi, B.K., Wong, Y.M., Barbosa, R., Lu, W.

    Veröffentlicht in Diamond and related materials

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  4. 4
    Effect of rearranging sp2/sp3 hybridized-bonding on the field emission characteristics of nano-crystalline diamond films

    Effect of rearranging sp2/sp3 hybridized-bonding on the field emission characteristics of nano-crystalline diamond films von LEQUAN, X. C, KANG, W. P, DAVIDSON, J. L, CHOI, B. K, WONG, Y. M, BARBOSA, R, LU, W


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