Quantitative grain growth and rotation probed by in-situ TEM straining and orientation mapping in small grained Al thin films von Mompiou, F., Legros, M.

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Atomic-scale simulation of screw dislocation/coherent twin boundary interaction in Al, Au, Cu and Ni von Chassagne, M., Legros, M., Rodney, D.

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Disconnections kinks and competing modes in shear-coupled grain boundary migration von Combe, N., Mompiou, F., Legros, M.

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Elementary mechanisms of shear-coupled grain boundary migration von Rajabzadeh, A, Mompiou, F, Legros, M, Combe, N

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Grain boundary shear–migration coupling—I. In situ TEM straining experiments in Al polycrystals von Mompiou, F., Caillard, D., Legros, M.

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The role of disconnections in deformation-coupled grain boundary migration von Rajabzadeh, A., Mompiou, F., Lartigue-Korinek, S., Combe, N., Legros, M., Molodov, D.A.

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In situ TEM nanomechanics von Yu, Q., Legros, M., Minor, A.M.

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Inter- and intragranular plasticity mechanisms in ultrafine-grained Al thin films: An in situ TEM study von Mompiou, F., Legros, M., Boé, A., Coulombier, M., Raskin, J.-P., Pardoen, T.

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Evolution of extended defects in polycrystalline UO2 under heavy ion irradiation: combined TEM, XRD and Raman study von Onofri, C., Sabathier, C., Palancher, H., Carlot, G., Miro, S., Serruys, Y., Desgranges, L., Legros, M.

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Grain-boundary shear-migration coupling. II. Geometrical model for general boundaries von Caillard, D., Mompiou, F., Legros, M.

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Stress-assisted discontinuous grain growth and its effect on the deformation behavior of nanocrystalline aluminum thin films von Gianola, D.S., Van Petegem, S., Legros, M., Brandstetter, S., Van Swygenhoven, H., Hemker, K.J.

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Impact of in situ nanomechanics on physical metallurgy von Kacher, J., Kirchlechner, C., Michler, J., Polatidis, E., Schwaiger, R., Van Swygenhoven, H., Taheri, M., Legros, M.

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Direct observation and quantification of grain boundary shear-migration coupling in polycrystalline Al von Mompiou, F., Legros, M., Caillard, D.

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Quantitative In Situ Mechanical Testing in Electron Microscopes von Legros, M., Gianola, D.S., Motz, C.

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In situ TEM study of twin boundary migration in sub-micron Be fibers von Mompiou, F., Legros, M., Ensslen, C., Kraft, O.

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Evolution of extended defects in polycrystalline Au-irradiated UO2 using in situ TEM: Temperature and fluence effects von Onofri, C., Sabathier, C., Baumier, C., Bachelet, C., Palancher, H., Legros, M.

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Heterogeneous disconnection nucleation mechanisms during grain boundary migration von Combe, N., Mompiou, F., Legros, M.

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SMIG model: A new geometrical model to quantify grain boundary-based plasticity von Mompiou, F., Legros, M., Caillard, D.

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Full characterization of dislocations in ion-irradiated polycrystalline UO2 von Onofri, C., Legros, M., Léchelle, J., Palancher, H., Baumier, C., Bachelet, C., Sabathier, C.

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Reduction of dislocation densities in single crystal CVD diamond by using self-assembled metallic masks von Naamoun, M., Tallaire, A., Doppelt, P., Gicquel, A., Legros, M., Barjon, J., Achard, J.

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